{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,31]],"date-time":"2022-03-31T10:28:03Z","timestamp":1648722483492},"reference-count":33,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"10","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Trans. Electron."],"published-print":{"date-parts":[[2021,10,1]]},"DOI":"10.1587\/transele.2020ctp0001","type":"journal-article","created":{"date-parts":[[2021,4,8]],"date-time":"2021-04-08T22:19:01Z","timestamp":1617920341000},"page":"607-616","source":"Crossref","is-referenced-by-count":0,"title":["A Method for Detecting Timing of Photodiode Saturation without In-Pixel TDC for High-Dynamic-Range CMOS Image Sensor"],"prefix":"10.1587","volume":"E104.C","author":[{"given":"Yuji","family":"INAGAKI","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering and Electronics, College of Science and Engineering, Aoyama Gakuin University"}]},{"given":"Yasuyuki","family":"MATSUYA","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Electronics, College of Science and Engineering, Aoyama Gakuin University"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"crossref","unstructured":"[1] M. Sasaki, M. Mase, S. Kawahito, and Y. Tadokoro, \u201cA wide-dynamic-range CMOS image sensor based on multiple short exposure-time readout with multiple-resolution column-parallel ADC,\u201d IEEE Sensors J., vol.7, no.1, pp.151-158, Jan. 2007. 10.1109\/jsen.2006.888058","DOI":"10.1109\/JSEN.2006.888058"},{"key":"2","doi-asserted-by":"publisher","unstructured":"[2] W. Zhang and W. Cham, \u201cGradient-directed multiexposure composition,\u201d IEEE Trans. Image Process., vol.21, no.4, pp.2318-2323, April 2012. 10.1109\/tip.2011.2170079","DOI":"10.1109\/TIP.2011.2170079"},{"key":"3","doi-asserted-by":"publisher","unstructured":"[3] X. Qian, H. Yu, S. Chen, and K.S. Low, \u201cA high dynamic range CMOS image sensor with dual-exposure charge subtraction scheme,\u201d IEEE Sensors J., vol.15, no.2, pp.661-662, Feb. 2015. 10.1109\/jsen.2014.2365173","DOI":"10.1109\/JSEN.2014.2365173"},{"key":"4","doi-asserted-by":"publisher","unstructured":"[4] D. Sugimura, T. Mikami, H. Yamashita, and T. Hamamoto, \u201cEnhancing color images of extremely low light scenes based on RGB\/NIR images acquisition with different exposure times,\u201d IEEE Trans. Image Process., vol.24, no.11, pp.3586-3597, Nov. 2015. 10.1109\/tip.2015.2448356","DOI":"10.1109\/TIP.2015.2448356"},{"key":"5","doi-asserted-by":"publisher","unstructured":"[5] M. Kobayashi, Y. Onuki, K. Kawabata, H. Sekine, T. Tsuboi, T. Muto, T. Akiyama, Y. Matsuno, H. Takahashi, T. Koizumi, K.Sakurai, H. Yuzurihara, S. Inoue, and T. Ichikawa, \u201cA 1.8e-rms Temporal noise over 110-dB-dynamic range 3.4 \u00b5m pixel pitch global-shutter CMOS image sensor with dual-gain amplifiers SS-ADC, light guide structure, and multiple-accumulation shutter,\u201d IEEE J. Solid-State Circuits, vol.53, no.1, pp.219-228, Jan. 2018. 10.1109\/jssc.2017.2737143","DOI":"10.1109\/JSSC.2017.2737143"},{"key":"6","doi-asserted-by":"publisher","unstructured":"[6] G. Storm, R. Henderson, J.E.D. Hurwitz, D. Renshaw, K.Findlater, and M. Purcell, \u201cExtended dynamic range from a combined linear-logarithmic CMOS image sensor,\u201d IEEE J. Solid-State Circuits, vol.41, no.9, pp.2095-2106, Sept. 2006. 10.1109\/jssc.2006.880613","DOI":"10.1109\/JSSC.2006.880613"},{"key":"7","doi-asserted-by":"publisher","unstructured":"[7] W. Chou, S. Yeh, C. Chiu, and C. Hsieh, \u201cA linear-logarithmic CMOS image sensor with pixel-FPN reduction and tunable response curve,\u201d IEEE Sensors J., vol.14, no.5, pp.1625-1632, May 2014. 10.1109\/jsen.2013.2294740","DOI":"10.1109\/JSEN.2013.2294740"},{"key":"8","doi-asserted-by":"publisher","unstructured":"[8] M. Bae, B. Choi, S. Jo, H. Lee, P. Choi, and J. Shin, \u201cA linear-logarithmic CMOS image sensor with adjustable dynamic range,\u201d IEEE Sensors J., vol.16, no.13, pp.5222-5226, July 2016. 10.1109\/jsen.2016.2562638","DOI":"10.1109\/JSEN.2016.2562638"},{"key":"9","doi-asserted-by":"publisher","unstructured":"[9] Z. Gao, S. Yao, C. Yang, and J. Xu, \u201cA dynamic range extension technique for CMOS image sensors with in-pixel dual exposure synthesis,\u201d IEEE Sensors J., vol.15, no.6, pp.3265-3273, June 2015. 10.1109\/jsen.2014.2379942","DOI":"10.1109\/JSEN.2014.2379942"},{"key":"10","doi-asserted-by":"publisher","unstructured":"[10] S. Yeh, C. Hsieh, C. Cheng, and C. Liu, \u201cA dual-exposure single-capture wide dynamic range CMOS image sensor with columnwise highly\/lowly illuminated pixel detection,\u201d IEEE Trans. Electron Devices, vol.59, no.7, pp.1948-1955, July 2012. 10.1109\/ted.2012.2193885","DOI":"10.1109\/TED.2012.2193885"},{"key":"11","doi-asserted-by":"crossref","unstructured":"[11] F. Lalanne, P. Malinge, D. H\u00e9rault, C. Jamin-Mornet, and N.Virollet, \u201cA 750 K Photocharge Linear Full Well in a 3.2 \u00b5m HDR Pixel with Complementary Carrier Collection,\u201d MDPI Sensors, vol.18, no.1, p.305, Jan. 2018. 10.3390\/s18010305","DOI":"10.3390\/s18010305"},{"key":"12","doi-asserted-by":"crossref","unstructured":"[12] M. Mori, Y. Sakata, M. Usuda, S. Yamahira, S. Kasuga, Y. Hirose, Y. Kato, and T. Tanaka, \u201cA 1280\u00d7720 single-photon-detecting image sensor with 100dB dynamic range using a sensitivity-boosting technique,\u201d 2016 ISSCC, pp.120-121, San Francisco, US, Feb. 2019. 10.1109\/isscc.2016.7417936","DOI":"10.1109\/ISSCC.2016.7417936"},{"key":"13","doi-asserted-by":"publisher","unstructured":"[13] H. Ouh, B. Shen, and M.L. Johnston, \u201cCombined in-pixel linear and single-photon avalanche diode operation with integrated biasing for wide-dynamic-range optical sensing,\u201d IEEE J. Solid-State Circuits, vol.55, no.2, pp.392-403, Feb. 2020. 10.1109\/jssc.2019.2944856","DOI":"10.1109\/JSSC.2019.2944856"},{"key":"14","unstructured":"[14] J. Solhusvik, T. Willassen, S. Mikkelsen, M. Wilhelmsen, S.Manabe, D. Mao, Z. He, K. Mabuchi, and T. Hasegawa, \u201cA 1280x960 2.8\u00b5m HDR CIS with DCG and Split-Pixel Combined,\u201d 2019 International Image Sensor Workshop, p.R32, Snowbird, US, June 2019."},{"key":"15","doi-asserted-by":"crossref","unstructured":"[15] Y. Sakano, T. Toyoshima, R. Nakamura, T. Asatsuma, Y. Hattori, T. Yamanaka, R. Yoshikawa, N. Kawazu, T. Matsuura, T. Iinuma, T. Toya, T. Watanabe, A. Suzuki, Y. Motohashi, J. Azami, Y. Tateshita, and T. Haruta, \u201cA 132dB Single-Exposure-Dynamic-Range CMOS Image Sensor with High Temperature Tolerance,\u201d 2020 ISSCC, pp.106-108, San Francisco, US, Feb. 2020. 10.1109\/isscc19947.2020.9063095","DOI":"10.1109\/ISSCC19947.2020.9063095"},{"key":"16","doi-asserted-by":"publisher","unstructured":"[16] N. Akahane, S. Adachi, K. Mizobuchi, and S. Sugawa, \u201cOptimum design of conversion gain and full well capacity in CMOS image sensor with lateral overflow integration capacitor,\u201d IEEE Trans. Electron Devices, vol.56, no.11, pp.2429-2435, Nov. 2009. 10.1109\/ted.2009.2030550","DOI":"10.1109\/TED.2009.2030550"},{"key":"17","doi-asserted-by":"crossref","unstructured":"[17] Y. Sakano, S. Sakai, Y. Tashiro, Y. Kato, K. Akiyama, K. Honda, M. Sato, M. Sakakibara, T. Taura, K. Azami, T. Hirano, Y. Oike, Y. Sogo, T. Ezaki, T. Narabu, T. Hirayama, and S. Sugawa, \u201c224-ke Saturation signal global shutter CMOS image sensor with in-pixel pinned storage and lateral overflow integration capacitor,\u201d 2017 Symposium on VLSI Circuits, pp.C250-C251, Kyoto, Japan, June 2017. 10.23919\/vlsic.2017.8008498","DOI":"10.23919\/VLSIC.2017.8008498"},{"key":"18","doi-asserted-by":"publisher","unstructured":"[18] I. Takayanagi, K. Miyauchi, S. Okura, K. Mori, J. Nakamura, and S. Sugawa, \u201cA 120-ke-Full-Well Capacity 160-\u00b5V\/e-Conversion Gain 2.8-\u00b5m Backside-Illuminated Pixel with a Lateral Overflow Integration Capacitor,\u201d MDPI Sensors, vol.19, no.24, p.5572, Dec. 2019. 10.3390\/s19245572","DOI":"10.3390\/s19245572"},{"key":"19","doi-asserted-by":"publisher","unstructured":"[19] Y. Fujihara, M. Murata, S. Nakayama, R. Kuroda, and S. Sugawa, \u201cAn over 120 dB single exposure wide dynamic range CMOS image sensor with two-stage lateral overflow integration capacitor,\u201d IEEE Trans. Electron Devices, vol.68, no.1, pp.152-157, Jan. 2021. 10.1109\/ted.2020.3038621","DOI":"10.1109\/TED.2020.3038621"},{"key":"20","doi-asserted-by":"publisher","unstructured":"[20] X. Wang, W. Wong, and R. Hornsey, \u201cA high dynamic range CMOS image sensor with inpixel light-to-frequency conversion,\u201d IEEE Trans. Electron Devices, vol.53, no.12, pp.2988-2992, Dec. 2006. 10.1109\/ted.2006.885642","DOI":"10.1109\/TED.2006.885642"},{"key":"21","doi-asserted-by":"publisher","unstructured":"[21] C. Shoushun and A. Bermak, \u201cArbitrated time-to-first spike CMOS image sensor with on-chip histogram equalization,\u201d IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol.15, no.3, pp.346-357, March 2007. 10.1109\/tvlsi.2007.893624","DOI":"10.1109\/TVLSI.2007.893624"},{"key":"22","doi-asserted-by":"publisher","unstructured":"[22] J.A. Le\u00f1ero-Bardallo, R. Carmona-Gal\u00e1n, and \u00c1. Rodr\u00edguez-V\u00e1zquez, \u201cA wide linear dynamic range image sensor based on asynchronous self-reset and tagging of saturation events,\u201d IEEE J. Solid-State Circuits, vol.52, no.6, pp.1605-1617, June 2017. 10.1109\/jssc.2017.2679058","DOI":"10.1109\/JSSC.2017.2679058"},{"key":"23","doi-asserted-by":"publisher","unstructured":"[23] S. Hirsch, M. Strobel, W. Klingler, J.D.S. Sp\u00fcntrup, Z. Yu, and J.N. Burghartz, \u201cRealization and opto-electronic characterization of linear self-reset pixel cells for a high dynamic CMOS image sensor,\u201d Advances in Radio Science, vol.17, pp.239-247, Sept. 2019. 10.5194\/ars-17-239-2019","DOI":"10.5194\/ars-17-239-2019"},{"key":"24","doi-asserted-by":"publisher","unstructured":"[24] A. Kitchen, A. Bermak, and A. Bouzerdoum, \u201cA digital pixel sensor array with programmable dynamic range,\u201d IEEE Trans. Electron Devices, vol.52, no.12, pp.2591-2601, Dec. 2005. 10.1109\/ted.2005.859698","DOI":"10.1109\/TED.2005.859698"},{"key":"25","doi-asserted-by":"publisher","unstructured":"[25] J.P. Crooks, S.E. Bohndiek, C.D. Arvanitis, R. Speller, H. XingLiang, E.G. Villani, M. Towrie, and R. Turchetta, \u201cA CMOS image sensor with in-pixel ADC, timestamp, and sparse readout,\u201d IEEE Sensors J., vol.9, no.1, pp.20-28, Jan. 2009. 10.1109\/jsen.2008.2008407","DOI":"10.1109\/JSEN.2008.2008407"},{"key":"26","doi-asserted-by":"publisher","unstructured":"[26] S. Vargas-Sierra, G. Lin\u00e1n-Cembrano, and \u00c1. Rodr\u00edguez-V\u00e1zquez, \u201cA 151 dB high dynamic range CMOS image sensor chip architecture with tone mapping compression embedded in-pixel,\u201d IEEE Sensors J., vol.15, no.1, pp.180-195, Jan. 2015. 10.1109\/jsen.2014.2340875","DOI":"10.1109\/JSEN.2014.2340875"},{"key":"27","doi-asserted-by":"publisher","unstructured":"[27] D.X.D. Yang, B. Fowler, and A. El Gamal, \u201cA nyquist-rate pixel-level ADC for CMOS image sensors,\u201d IEEE J. Solid-State Circuits, vol.34, no.3, pp.348-356, March 1999. 10.1109\/4.748186","DOI":"10.1109\/4.748186"},{"key":"28","doi-asserted-by":"publisher","unstructured":"[28] M. Sakakibara, K. Ogawa, S. Sakai, Y. Tochigi, K. Honda, H. Kikuchi, T. Wada, Y. Kamikubo, T. Miura, M. Nakamizo, N. Jyo, R. Hayashibara, S. Miyata, S. Yamamoto, Y. Ota, H. Takahashi, T. Taura, Y. Oike, K. Tatani, T. Ezaki, and T. Hirayama, \u201cA 6.9-\u00b5m pixel-pitch back-illuminated global shutter CMOS image sensor with pixel-parallel 14-bit subthreshold ADC,\u201d IEEE J. Solid-State Circuits, vol.53, no.11, pp.3017-3025, Nov. 2018. 10.1109\/jssc.2018.2863947","DOI":"10.1109\/JSSC.2018.2863947"},{"key":"29","unstructured":"[29] Y. Inagaki and Y. Matsuya, \u201cA Study of a High Dynamic Range CMOS Image Sensor with Timing Detection of Pixel Saturation,\u201d 2018 International Conference on Analog VLSI Circuits, pp.85-88, Chiang Mai, Thailand, Nov. 2018."},{"key":"30","doi-asserted-by":"publisher","unstructured":"[30] S. Xie and A.J.P. Theuwissen, \u201cOn-chip smart temperature sensors for dark current compensation in CMOS image sensors,\u201d IEEE Sensors J., vol.19, no.18, pp.7849-7860, Sept. 2019. 10.1109\/jsen.2019.2919655","DOI":"10.1109\/JSEN.2019.2919655"},{"key":"31","doi-asserted-by":"publisher","unstructured":"[31] V. Brajovic and T. Kanade, \u201cA VLSI sorting image sensor: Global massively parallel intensity-to-time processing for low-latency adaptive vision,\u201d IEEE Trans. Robot. Autom., vol.15, no.1, pp.67-75, Feb. 1999. 10.1109\/70.744603","DOI":"10.1109\/70.744603"},{"key":"32","doi-asserted-by":"publisher","unstructured":"[32] T. Lule, B. Schneider, and M. Bohm, \u201cDesign and fabrication of a high-dynamic-range image sensor in TFA technology,\u201d IEEE J. Solid-State Circuits, vol.34, no.5, pp.704-711, May 1999. 10.1109\/4.760382","DOI":"10.1109\/4.760382"},{"key":"33","doi-asserted-by":"crossref","unstructured":"[33] T. Toyama, K. Mishina, H. Tsuchiya, T. Ichikawa, H. Iwaki, Y. Gendai, H. Murakami, K. Takamiya, H. Shiroshita, Y. Muramatsu, and T. Furusawa, \u201cA 17.7Mpixel 120fps CMOS image sensor with 34.8Gb\/s readout,\u201d 2011 ISSCC, pp.420-422, San Francisco, US, Feb. 2011. 10.1109\/isscc.2011.5746379","DOI":"10.1109\/ISSCC.2011.5746379"}],"container-title":["IEICE Transactions on Electronics"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/transele\/E104.C\/10\/E104.C_2020CTP0001\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,2]],"date-time":"2021-10-02T03:39:05Z","timestamp":1633145945000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/transele\/E104.C\/10\/E104.C_2020CTP0001\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,1]]},"references-count":33,"journal-issue":{"issue":"10","published-print":{"date-parts":[[2021]]}},"URL":"https:\/\/doi.org\/10.1587\/transele.2020ctp0001","relation":{},"ISSN":["0916-8524","1745-1353"],"issn-type":[{"value":"0916-8524","type":"print"},{"value":"1745-1353","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,10,1]]},"article-number":"2020CTP0001"}}