{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,2]],"date-time":"2022-04-02T16:08:10Z","timestamp":1648915690214},"reference-count":0,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"4","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Trans. Electron."],"published-print":{"date-parts":[[2022,4,1]]},"DOI":"10.1587\/transele.2021ref0001","type":"journal-article","created":{"date-parts":[[2022,3,31]],"date-time":"2022-03-31T22:14:54Z","timestamp":1648764894000},"page":"126-127","source":"Crossref","is-referenced-by-count":0,"title":["FOREWORD"],"prefix":"10.1587","volume":"E105.C","author":[{"given":"Koichi","family":"HIRAYAMA","sequence":"first","affiliation":[{"name":"Kitami Institute of Technology"}]},{"given":"Hiroyuki","family":"DEGUCHI","sequence":"additional","affiliation":[{"name":"Doshisha University"}]}],"member":"532","container-title":["IEICE Transactions on Electronics"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/transele\/E105.C\/4\/E105.C_2021REF0001\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,3,31]],"date-time":"2022-03-31T22:14:54Z","timestamp":1648764894000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/transele\/E105.C\/4\/E105.C_2021REF0001\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,4,1]]},"references-count":0,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2022]]}},"URL":"https:\/\/doi.org\/10.1587\/transele.2021ref0001","relation":{},"ISSN":["0916-8524","1745-1353"],"issn-type":[{"value":"0916-8524","type":"print"},{"value":"1745-1353","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,4,1]]},"article-number":"2021REF0001"}}