{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,15]],"date-time":"2026-07-15T16:44:36Z","timestamp":1784133876674,"version":"3.55.0"},"reference-count":19,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"8","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Trans. Inf. & Syst."],"published-print":{"date-parts":[[2017]]},"DOI":"10.1587\/transinf.2016edl8238","type":"journal-article","created":{"date-parts":[[2017,7,31]],"date-time":"2017-07-31T22:19:34Z","timestamp":1501539574000},"page":"1903-1906","source":"Crossref","is-referenced-by-count":16,"title":["Kernel CCA Based Transfer Learning for Software Defect Prediction"],"prefix":"10.1587","volume":"E100.D","author":[{"given":"Ying","family":"MA","sequence":"first","affiliation":[{"name":"Xiamen University of Technology"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shunzhi","family":"ZHU","sequence":"additional","affiliation":[{"name":"Xiamen University of Technology"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yumin","family":"CHEN","sequence":"additional","affiliation":[{"name":"Xiamen University of Technology"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jingjing","family":"LI","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"publisher","unstructured":"[1] T. Menzies, J. Greenwald, and A. Frank, \u201cData mining static code attributes to learn defect predictors,\u201d IEEE Trans. Softw. Eng., vol.33, no.1, pp.2-13, 2007. 10.1109\/tse.2007.256941","DOI":"10.1109\/TSE.2007.256941"},{"key":"2","doi-asserted-by":"publisher","unstructured":"[2] C. Catal, \u201cSoftware fault prediction: A literature review and current trends,\u201d Expert Systems with Applications: An International Journal, vol.38, no.4, pp.4626-4636, 2011. 10.1016\/j.eswa.2010.10.024","DOI":"10.1016\/j.eswa.2010.10.024"},{"key":"3","doi-asserted-by":"crossref","unstructured":"[3] T. Menzies, E. Kocaguneli, F. Peters, B. Turhan, and L.L. Minku, \u201cData science for software engineering,\u201d International Conference on Software Engineering, pp.1484-1486, 2013. 10.1109\/icse.2013.6606752","DOI":"10.1109\/ICSE.2013.6606752"},{"key":"4","doi-asserted-by":"crossref","unstructured":"[4] Y. Kamei and E. Shihab, \u201cDefect prediction: Accomplishments and future challenges,\u201d 2016 IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering, pp.33-45, 2016. 10.1109\/saner.2016.56","DOI":"10.1109\/SANER.2016.56"},{"key":"5","doi-asserted-by":"crossref","unstructured":"[5] T. Menzies, L. Minku, and F. Peters, \u201cThe art and science of analyzing software data; Quantitative methods,\u201d 2015 IEEE\/ACM 37th International Conference on Software Engineering, pp.959-960, 2015. 10.1109\/icse.2015.306","DOI":"10.1109\/ICSE.2015.306"},{"key":"6","unstructured":"[6] S.J. Pan and Q. Yang, \u201cA survey on transfer learning,\u201d Technical Report HKUST-CS 08-08, Department of Computer Science and Engineering, Hong Kong University of Science and Technology, 2008."},{"key":"7","doi-asserted-by":"publisher","unstructured":"[7] B. Turhan, T. Menzies, A.B. Bener, and J. Di Stefano, \u201cOn the relative value of cross-company and within-company data for defect prediction,\u201d Empirical Software Engineering, vol.14, no.5, pp.540-578, 2009. 10.1007\/s10664-008-9103-7","DOI":"10.1007\/s10664-008-9103-7"},{"key":"8","doi-asserted-by":"crossref","unstructured":"[8] T. Zimmermann, N. Nagappan, H. Gall, E. Giger, and B. Murphy, \u201cCross-project defect prediction: A large scale experiment on data vs. domain vs. process,\u201d Proc. 7th Joint Meeting of the European Software Engineering Conference and the ACM SIGSOFT Symposium on the Foundations of Software Engineering (ESEC\/FSE), pp.91-100, 2009. 10.1145\/1595696.1595713","DOI":"10.1145\/1595696.1595713"},{"key":"9","doi-asserted-by":"publisher","unstructured":"[9] Z. He, F. Shu, Y. Yang, M. Li, and Q. Wang, \u201cAn investigation on the feasibility of cross-project defect prediction,\u201d Automated Software Engineering, vol.19, no.2, pp.167-199, 2012. 10.1007\/s10515-011-0090-3","DOI":"10.1007\/s10515-011-0090-3"},{"key":"10","doi-asserted-by":"publisher","unstructured":"[10] B. Turhan, A.T. Misirli, and A. Bener, \u201cEmpirical evaluation of the effects of mixed project data on learning defect predictors,\u201d Information and Software Technology, vol.55, no.6, pp.1101-1118, 2013. 10.1016\/j.infsof.2012.10.003","DOI":"10.1016\/j.infsof.2012.10.003"},{"key":"11","doi-asserted-by":"publisher","unstructured":"[11] T. Devine, K. Goseva-Popstojanova, S. Krishnan, and R.R. Lutz, \u201cAssessment and cross-product prediction of software product line quality: Accounting for reuse across products, over multiple releases,\u201d Automated Software Engineering, vol.23, no.2, pp.253-302, 2016. 10.1007\/s10515-014-0160-4","DOI":"10.1007\/s10515-014-0160-4"},{"key":"12","doi-asserted-by":"publisher","unstructured":"[12] Y. Ma, G. Luo, X. Zeng, and A. Chen, \u201cTransfer learning for cross-company software defect prediction,\u201d Information and Software Technology, vol.54, no.3, pp.248-256, 2012. 10.1016\/j.infsof.2011.09.007","DOI":"10.1016\/j.infsof.2011.09.007"},{"key":"13","doi-asserted-by":"crossref","unstructured":"[13] J. Nam, S.J. Pan, and S. Kim, \u201cTransfer defect learning,\u201d Proc. 35th International Conference on Software Engineering (ICSE), pp.382-391, 2013. 10.1109\/icse.2013.6606584","DOI":"10.1109\/ICSE.2013.6606584"},{"key":"14","doi-asserted-by":"publisher","unstructured":"[14] L. Chen, B. Fang, Z. Shang, and Y. Tang, \u201cNegative samples reduction in cross-company software defects prediction,\u201d Information and Software Technology, vol.62, pp.67-77, 2015. 10.1016\/j.infsof.2015.01.014","DOI":"10.1016\/j.infsof.2015.01.014"},{"key":"15","doi-asserted-by":"crossref","unstructured":"[15] D. Ryu, O. Choi, and J. Baik, \u201cImproving prediction robustness of VAB-SVM for cross-project defect prediction,\u201d 2014 IEEE 17th International Conference on Computational Science and Engineering, pp.994-999, 2014. 10.1109\/cse.2014.198","DOI":"10.1109\/CSE.2014.198"},{"key":"16","doi-asserted-by":"crossref","unstructured":"[16] X. Jing, F. Wu, X. Dong, F. Qi, and B. Xu, \u201cHeterogeneous cross-company defect prediction by unified metric representation and CCA-based transfer learning,\u201d Proc. 10th Joint Meeting of the European Software Engineering Conference and the ACM SIGSOFT Symposium on the Foundations of Software Engineering (ESEC\/FSE), pp.496-507, 2015. 10.1145\/2786805.2786813","DOI":"10.1145\/2786805.2786813"},{"key":"17","doi-asserted-by":"publisher","unstructured":"[17] D.R. Hardoon, S.R. Szedmak, and J.R. Shawe-Taylor, \u201cCanonical correlation analysis: An overview with application to learning methods,\u201d Neural Comput., vol.16, no.12, pp.2639-2664, 2004. 10.1162\/0899766042321814","DOI":"10.1162\/0899766042321814"},{"key":"18","unstructured":"[18] K. Fukumizu, F.R. Bach, and A. Gretton, \u201cStatistical consistency of kernel canonical correlation analysis,\u201d Journal of Machine Learning Research, vol.8, pp.361-383, 2007."},{"key":"19","unstructured":"[19] G. Boetticher, T. Menzies, and T. Ostrand, The PROMISE Repository of Empirical Software Engineering Data, 2007. http:\/\/promisedata.org\/repository"}],"container-title":["IEICE Transactions on Information and Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/transinf\/E100.D\/8\/E100.D_2016EDL8238\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T21:36:33Z","timestamp":1569965793000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/transinf\/E100.D\/8\/E100.D_2016EDL8238\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017]]},"references-count":19,"journal-issue":{"issue":"8","published-print":{"date-parts":[[2017]]}},"URL":"https:\/\/doi.org\/10.1587\/transinf.2016edl8238","relation":{},"ISSN":["0916-8532","1745-1361"],"issn-type":[{"value":"0916-8532","type":"print"},{"value":"1745-1361","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017]]}}}