{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,11]],"date-time":"2026-05-11T10:24:42Z","timestamp":1778495082071,"version":"3.51.4"},"reference-count":13,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"8","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Trans. Inf. & Syst."],"published-print":{"date-parts":[[2022,8,1]]},"DOI":"10.1587\/transinf.2022edl8024","type":"journal-article","created":{"date-parts":[[2022,7,31]],"date-time":"2022-07-31T22:19:43Z","timestamp":1659305983000},"page":"1490-1494","source":"Crossref","is-referenced-by-count":2,"title":["Improving Fault Localization Using Conditional Variational Autoencoder"],"prefix":"10.1587","volume":"E105.D","author":[{"given":"Xianmei","family":"FANG","sequence":"first","affiliation":[{"name":"School of Big Data and Computer Science, Hechi University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaobo","family":"GAO","sequence":"additional","affiliation":[{"name":"School of Big Data and Computer Science, Hechi University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuting","family":"WANG","sequence":"additional","affiliation":[{"name":"School of Big Data and Computer Science, Hechi University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhouyu","family":"LIAO","sequence":"additional","affiliation":[{"name":"School of Big Data and Computer Science, Hechi University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yue","family":"MA","sequence":"additional","affiliation":[{"name":"School of Big Data and Computer Science, Hechi University"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"publisher","unstructured":"[1] X. Mao, Y. Lei, Z. Dai, Y. Qi, and C. Wang, \u201cSlice-based statistical fault localization,\u201d J. Syst. Softw., vol.89, no.1, pp.51-62, 2014. 10.1016\/j.jss.2013.08.031","DOI":"10.1016\/j.jss.2013.08.031"},{"key":"2","doi-asserted-by":"publisher","unstructured":"[2] Z. Zhang, Y. Lei, Q. Tan, X. Mao, P. Zeng, and X. Chang, \u201cDeep learning-based fault localization with contextual information,\u201dIEICE Trans. Inf. & Sys., vol.E100-D, no.12, pp.3027-3031, Dec. 2017. 10.1587\/transinf.2017edl8143","DOI":"10.1587\/transinf.2017EDL8143"},{"key":"3","doi-asserted-by":"crossref","unstructured":"[3] S. Pearson, J. Campos, R. Just, G. Fraser, R. Abreu, M.D. Ernst, D. Pang, and B. Keller, \u201cEvaluating and improving fault localization,\u201d 2017 IEEE\/ACM 39th International Conference on Software Engineering (ICSE), pp.609-620, 2017. 10.1109\/icse.2017.62","DOI":"10.1109\/ICSE.2017.62"},{"key":"4","doi-asserted-by":"publisher","unstructured":"[4] Z. Zhang, Y. Lei, J. Xu, X. Mao, and X. Chang, \u201cTFIDF-FL: Localizing faults using term frequency-inverse document frequency and deep learning,\u201d IEICE Trans. Inf. & Syst., vol.E102-D, no.9, pp.1860-1864, Sept. 2019. 10.1587\/transinf.2018edl8237","DOI":"10.1587\/transinf.2018EDL8237"},{"key":"5","doi-asserted-by":"publisher","unstructured":"[5] Z. Zhang, Y. Lei, X. Mao, M. Yan, L. Xu, and X. Zhang, \u201cA study of effectiveness of deep learning in locating real faults,\u201d Inform. Softw. Tech., vol.131, 106486, 2021. 10.1016\/j.infsof.2020.106486","DOI":"10.1016\/j.infsof.2020.106486"},{"key":"6","doi-asserted-by":"publisher","unstructured":"[6] Y. Lei, C. Sun, X. Mao, and Z. Su, \u201cHow test suites impact fault localisation starting from the size,\u201d IET Softw., vol.12, no.3, pp.190-205, 2018. 10.1049\/iet-sen.2017.0026","DOI":"10.1049\/iet-sen.2017.0026"},{"key":"7","doi-asserted-by":"publisher","unstructured":"[7] L. Zhang, L. Yan, Z. Zhang, J. Zhang, W.K. Chan, and Z. Zheng, \u201cA theoretical analysis on cloning the failed test cases to improve spectrum-based fault localization,\u201d J. Syst. Softw., vol.129, pp.35-57, 2017. 10.1016\/j.jss.2017.04.017","DOI":"10.1016\/j.jss.2017.04.017"},{"key":"8","doi-asserted-by":"publisher","unstructured":"[8] C. Shorten and T.M. Khoshgoftaar, \u201cA survey on image data augmentation for deep learning,\u201d J. Big Data, vol.6, no.1, pp.1-48, 2019. 10.1186\/s40537-019-0197-0","DOI":"10.1186\/s40537-019-0197-0"},{"key":"9","unstructured":"[9] K. Sohn, H. Lee, and X. Yan, \u201cLearning structured output representation using deep conditional generative models,\u201d Advances in Neural Information Processing Systems, vol.28, pp.3483-3491, 2015."},{"key":"10","doi-asserted-by":"crossref","unstructured":"[10] Z. Zhang, Y. Lei, X. Mao, and P. Li, \u201cCNN-FL: An effective approach for localizing faults using convolutional neural networks,\u201d 2019 IEEE 26th International Conference on Software Analysis, Evolution and Reengineering (SANER), pp.445-455, IEEE, 2019. 10.1109\/saner.2019.8668002","DOI":"10.1109\/SANER.2019.8668002"},{"key":"11","doi-asserted-by":"publisher","unstructured":"[11] Z. Zhang, Y. Lei, X. Mao, M. Yan, L. Xu, and J. Wen, \u201cImproving deep-learning-based fault localization with resampling,\u201d J. Softw.: Evol. Proc., vol.33, no.3, e2312, 2021. 10.1002\/smr.2312","DOI":"10.1002\/smr.2312"},{"key":"12","doi-asserted-by":"publisher","unstructured":"[12] W.E. Wong, R. Gao, Y. Li, R. Abreu, and F. Wotawa, \u201cA survey on software fault localization,\u201d IEEE Trans. Softw. Eng., vol.42, no.8, pp.707-740, 2016. 10.1109\/tse.2016.2521368","DOI":"10.1109\/TSE.2016.2521368"},{"key":"13","doi-asserted-by":"crossref","unstructured":"[13] P.S. Kochhar, X. Xia, D. Lo, and S. Li, \u201cPractitioners' expectations on automated fault localization,\u201d Proc. 25th International Symposium on Software Testing and Analysis, pp.165-176, 2016. 10.1145\/2931037.2931051","DOI":"10.1145\/2931037.2931051"}],"container-title":["IEICE Transactions on Information and Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/transinf\/E105.D\/8\/E105.D_2022EDL8024\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,6]],"date-time":"2022-08-06T03:37:58Z","timestamp":1659757078000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/transinf\/E105.D\/8\/E105.D_2022EDL8024\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,8,1]]},"references-count":13,"journal-issue":{"issue":"8","published-print":{"date-parts":[[2022]]}},"URL":"https:\/\/doi.org\/10.1587\/transinf.2022edl8024","relation":{},"ISSN":["0916-8532","1745-1361"],"issn-type":[{"value":"0916-8532","type":"print"},{"value":"1745-1361","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,8,1]]},"article-number":"2022EDL8024"}}