{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,2,5]],"date-time":"2023-02-05T05:12:46Z","timestamp":1675573966174},"reference-count":7,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Trans. Inf. & Syst."],"published-print":{"date-parts":[[2023,2,1]]},"DOI":"10.1587\/transinf.2022mpl0002","type":"journal-article","created":{"date-parts":[[2023,1,31]],"date-time":"2023-01-31T22:17:21Z","timestamp":1675203441000},"page":"166-169","source":"Crossref","is-referenced-by-count":0,"title":["A Comparative Study of Data Collection Periods for Just-In-Time Defect Prediction Using the Automatic Machine Learning Method"],"prefix":"10.1587","volume":"E106.D","author":[{"given":"Kosuke","family":"OHARA","sequence":"first","affiliation":[{"name":"Department of Computer Sc., Faculty of Eng., Ehime University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hirohisa","family":"AMAN","sequence":"additional","affiliation":[{"name":"Center for Information Technology, Ehime University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sousuke","family":"AMASAKI","sequence":"additional","affiliation":[{"name":"Faculty of Comp. Sc. & Systems Eng., Okayama Prefectural University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tomoyuki","family":"YOKOGAWA","sequence":"additional","affiliation":[{"name":"Faculty of Comp. Sc. & Systems Eng., Okayama Prefectural University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Minoru","family":"KAWAHARA","sequence":"additional","affiliation":[{"name":"Center for Information Technology, Ehime University"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"532","reference":[{"key":"1","unstructured":"[1] C. Jones, Applied Software Measurement: Global Analysis of Productivity and Quality, 3rd ed., McGraw-Hill, New York, 2008."},{"key":"2","doi-asserted-by":"publisher","unstructured":"[2] Y. Kamei, E. Shihab, B. Adams, A.E. Hassan, A. Mockus, A. Sinha, and N. Ubayashi, \u201cA large-scale empirical study of just-in-time quality assurance,\u201d IEEE Trans. Softw. Eng., vol.39, no.6, pp.757-773, Nov. 2013. 10.1109\/tse.2012.70","DOI":"10.1109\/TSE.2012.70"},{"key":"3","doi-asserted-by":"crossref","unstructured":"[3] N.C. Shrikanth, S. Majumder, and T. Menzies, \u201cEarly life cycle software defect prediction. Why? how?,\u201d Proc. IEEE\/ACM 43rd Int'l Conf. Softw. Eng., pp.448-459, May 2021. 10.1109\/icse43902.2021.00050","DOI":"10.1109\/ICSE43902.2021.00050"},{"key":"4","doi-asserted-by":"publisher","unstructured":"[4] S. McIntosh and Y. Kamei, \u201cAre fix-inducing changes a moving target? a longitudinal case study of just-in-time defect prediction,\u201d IEEE Trans. Softw. Eng., vol.44, no.5, pp.412-428, 2018. 10.1109\/tse.2017.2693980","DOI":"10.1109\/TSE.2017.2693980"},{"key":"5","unstructured":"[5] M. Feurer, A. Klein, K. Eggensperger, J.T. Springenberg, M. Blum, and F. Hutter, \u201cEfficient and robust automated machine learning,\u201d Proc. 28th Int'l Conf. Neural Inf. Processing Syst., pp.2755-2763, Dec. 2015."},{"key":"6","doi-asserted-by":"crossref","unstructured":"[6] C. Rosen, B. Grawi, and E. Shihab, \u201cCommit Guru: Analytics and risk prediction of software commits,\u201d Proc. 10th Joint Meeting on Foundations of Softw. Eng., pp.966-969, Aug. 2015. 10.1145\/2786805.2803183","DOI":"10.1145\/2786805.2803183"},{"key":"7","doi-asserted-by":"crossref","unstructured":"[7] N.V. Chawla, K.W. Bowyer, L.O. Hall, and W.P. Kegelmeyer, \u201cSMOTE: Synthetic minority over-sampling technique,\u201d J. Artificial Intelligence Research, vol.16, pp.321-357, June 2002. 10.1613\/jair.953","DOI":"10.1613\/jair.953"}],"container-title":["IEICE Transactions on Information and Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/transinf\/E106.D\/2\/E106.D_2022MPL0002\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,2,4]],"date-time":"2023-02-04T04:15:11Z","timestamp":1675484111000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/transinf\/E106.D\/2\/E106.D_2022MPL0002\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,2,1]]},"references-count":7,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2023]]}},"URL":"https:\/\/doi.org\/10.1587\/transinf.2022mpl0002","relation":{},"ISSN":["0916-8532","1745-1361"],"issn-type":[{"value":"0916-8532","type":"print"},{"value":"1745-1361","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,2,1]]},"article-number":"2022MPL0002"}}