{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T08:27:14Z","timestamp":1771662434681,"version":"3.50.1"},"reference-count":18,"publisher":"Zhejiang University Press","issue":"7","license":[{"start":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T00:00:00Z","timestamp":1656633600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T00:00:00Z","timestamp":1656633600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Front Inform Technol Electron Eng"],"published-print":{"date-parts":[[2022,7]]},"DOI":"10.1631\/fitee.2100255","type":"journal-article","created":{"date-parts":[[2022,7,25]],"date-time":"2022-07-25T07:04:03Z","timestamp":1658732643000},"page":"1110-1126","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["Cellular automata based multi-bit stuck-at fault diagnosis for resistive memory","\u57fa\u4e8e\u5143\u80de\u81ea\u52a8\u673a\u7684\u7535\u963b\u5b58\u50a8\u5668\u591a\u6bd4\u7279\u56fa\u5b9a\u578b\u6545\u969c\u8bca\u65ad"],"prefix":"10.1631","volume":"23","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9469-5696","authenticated-orcid":false,"given":"Sutapa","family":"Sarkar","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9394-8540","authenticated-orcid":false,"given":"Biplab Kumar","family":"Sikdar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mousumi","family":"Saha","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"635","published-online":{"date-parts":[[2022,7,25]]},"reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2016.11.001"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-15979-4_32"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/2540708.2540745"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1950.tb00463.x"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1735970.1736023"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2006.888349"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2014.2361150"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/dsn.2012.6263949"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669117"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2015.2417533"},{"key":"ref11","first-page":"176","article-title":"Cellular automata based fault tolerant resistive memory design","volume-title":"Proc 6th Int Symp on Embedded Computing and System Design","author":"Saha","year":"2016"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/cesys.2018.8723890"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ewdts.2017.8110053"},{"issue":"2","key":"ref14","first-page":"310","article-title":"Periodic boundary cellular automata based wear leveling for resistive memory","volume":"47","author":"Sarkar","year":"2020","journal-title":"IAENG Int J Comput Sci"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1816038.1815980"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/micro.2010.46"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/acssc.2006.354942"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1555754.1555759"}],"container-title":["Frontiers of Information Technology & Electronic Engineering"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1631\/FITEE.2100255.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1631\/FITEE.2100255\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1631\/FITEE.2100255.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T07:51:03Z","timestamp":1771660263000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1631\/FITEE.2100255"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,7]]},"references-count":18,"journal-issue":{"issue":"7","published-print":{"date-parts":[[2022,7]]}},"alternative-id":["1833"],"URL":"https:\/\/doi.org\/10.1631\/fitee.2100255","relation":{},"ISSN":["2095-9184","2095-9230"],"issn-type":[{"value":"2095-9184","type":"print"},{"value":"2095-9230","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,7]]},"assertion":[{"value":"26 May 2021","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"7 October 2021","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"25 July 2022","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}]}}