{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,4]],"date-time":"2026-04-04T18:19:30Z","timestamp":1775326770889,"version":"3.50.1"},"reference-count":33,"publisher":"Zhejiang University Press","issue":"9","license":[{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Front Inform Technol Electron Eng"],"published-print":{"date-parts":[[2023,9]]},"DOI":"10.1631\/fitee.2200512","type":"journal-article","created":{"date-parts":[[2023,9,22]],"date-time":"2023-09-22T05:02:16Z","timestamp":1695358936000},"page":"1302-1315","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["Mixture test strategy optimization for analog systems","\u6a21\u62df\u7cfb\u7edf\u7684\u6df7\u5408\u6d4b\u8bd5\u4f18\u5316\u65b9\u6cd5"],"prefix":"10.1631","volume":"24","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9376-9358","authenticated-orcid":false,"given":"Wenjuan","family":"Mei","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3406-0039","authenticated-orcid":false,"given":"Zhen","family":"Liu","sequence":"additional","affiliation":[]},{"given":"Ouhang","family":"Li","sequence":"additional","affiliation":[]},{"given":"Yuanzhang","family":"Su","sequence":"additional","affiliation":[]},{"given":"Yusong","family":"Mei","sequence":"additional","affiliation":[]},{"given":"Yongji","family":"Long","sequence":"additional","affiliation":[]}],"member":"635","published-online":{"date-parts":[[2023,9,22]]},"reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mspro.2014.07.212"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tsmca.2009.2014550"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2010.03.003"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2003.10.004"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2005.861490"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/0165-6074(92)90297-k"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tsmca.2007.893459"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/ccc52363.2021.9549825"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s11235-013-9678-1"},{"key":"ref10","first-page":"6390","article-title":"A new testability allocation method based on improved AHP","volume-title":"29th Chinese Control and Decision Conf","author":"Liu","year":"2017"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2019.06.055"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/icccas.2018.8768976"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.2139\/ssrn.3616690"},{"key":"ref14","first-page":"1097","article-title":"Mixture test strategy optimization based on heuristic programming","volume-title":"14th IEEE Int Conf on Electronic Measurement & Instruments","author":"Mei","year":"2015"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/s22062138"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.5267\/j.ijiec.2020.1.003"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/21.105086"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2019.2928484"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/tee.20585"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2019.05.072"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-018-5709-x"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/access.2018.2836139"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/aero.2004.1368051"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2018.03.037"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/rfit.2015.7377900"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tsmca.2003.809206"},{"key":"ref27","first-page":"272","article-title":"Tolerance analysis in MOSFET analog integrated circuits","volume-title":"Proc 7th WSEAS Int Conf on Systems Theory and Scientific Computation","author":"Vallette","year":"2007"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2012.2224074"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2019.105893"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/s1000-9361(11)60386-5"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2022.109611"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.cja.2013.04.054"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.3390\/s151025592"}],"container-title":["Frontiers of Information Technology & Electronic Engineering"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1631\/FITEE.2200512.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1631\/FITEE.2200512\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1631\/FITEE.2200512.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T07:06:44Z","timestamp":1771657604000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1631\/FITEE.2200512"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9]]},"references-count":33,"journal-issue":{"issue":"9","published-print":{"date-parts":[[2023,9]]}},"alternative-id":["512"],"URL":"https:\/\/doi.org\/10.1631\/fitee.2200512","relation":{},"ISSN":["2095-9184","2095-9230"],"issn-type":[{"value":"2095-9184","type":"print"},{"value":"2095-9230","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,9]]},"assertion":[{"value":"25 October 2022","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"8 February 2023","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"22 September 2023","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"Wenjuan MEI, Zhen LIU, Ouhang LI, Yuanzhang SU, Yusong MEI, and Yongji LONG declare that they have no conflict of interest.","order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Compliance with ethics guidelines"}}]}}