{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T19:45:12Z","timestamp":1771703112353,"version":"3.50.1"},"reference-count":26,"publisher":"Zhejiang University Press","issue":"6","license":[{"start":{"date-parts":[[2010,5,29]],"date-time":"2010-05-29T00:00:00Z","timestamp":1275091200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J. Zhejiang Univ. - Sci. C"],"published-print":{"date-parts":[[2010,6]]},"DOI":"10.1631\/jzus.c0910430","type":"journal-article","created":{"date-parts":[[2010,5,28]],"date-time":"2010-05-28T15:11:55Z","timestamp":1275059515000},"page":"425-434","source":"Crossref","is-referenced-by-count":10,"title":["Multiscale classification and its application to process monitoring"],"prefix":"10.1631","volume":"11","author":[{"given":"Yu-ming","family":"Liu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lu-bin","family":"Ye","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ping-you","family":"Zheng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiang-rong","family":"Shi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bin","family":"Hu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jun","family":"Liang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"635","published-online":{"date-parts":[[2010,5,29]]},"reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690490412"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/aic.10245"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690440712"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1162\/089976600300014980"},{"key":"ref5","first-page":"298","volume-title":"Pattern Recognition","author":"Bian","year":"2000"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/s0169-7439(99)00061-1"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2003.10.002"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2006.07.001"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(93)80018-I"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/aic.10325"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2008.03.006"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/72.991427"},{"key":"ref13","author":"Hsu","year":"2008","journal-title":"A Practical Guide to Support Vector Classification"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2004.01.025"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/s0098-1354(02)00093-5"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"160, 195","DOI":"10.1017\/CBO9780511841040","volume-title":"Wavelet Methods for Time Series Analysis","author":"Percival","year":"2000"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2008.09.007"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1021\/ie051313b"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/aic.11523"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"64, 103","DOI":"10.1007\/978-1-4471-0409-4","volume-title":"Data-Driven Methods for Fault Detection and Diagnosis in Chemical Process","author":"Russell","year":"2000"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/aic.10982"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1002\/cem.1060"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/s0959-1524(00)00008-1"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1002\/aic.10260"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1002\/aic.11515"},{"issue":"3","key":"ref26","first-page":"388","article-title":"On-line fault diagnosis in industrial process using variable moving window and hidden Markov model","volume":"13","author":"Zhou","year":"2005","journal-title":"Chin. J. Chem. Eng."}],"container-title":["Journal of Zhejiang University SCIENCE C"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1631\/jzus.C0910430.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1631\/jzus.C0910430\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1631\/jzus.C0910430","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T07:41:18Z","timestamp":1771659678000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1631\/jzus.C0910430"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,5,29]]},"references-count":26,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2010,6]]}},"alternative-id":["1108"],"URL":"https:\/\/doi.org\/10.1631\/jzus.c0910430","relation":{},"ISSN":["1869-1951","1869-196X"],"issn-type":[{"value":"1869-1951","type":"print"},{"value":"1869-196X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,5,29]]}}}