{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,9]],"date-time":"2025-11-09T10:35:47Z","timestamp":1762684547815,"version":"build-2065373602"},"reference-count":14,"publisher":"Wiley","issue":"1","license":[{"start":{"date-parts":[[2012,7,5]],"date-time":"2012-07-05T00:00:00Z","timestamp":1341446400000},"content-version":"vor","delay-in-days":796,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":["sid.onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Symp Digest of Tech Papers"],"published-print":{"date-parts":[[2010,5]]},"abstract":"<jats:title>Abstract<\/jats:title>\n                  <jats:p>\n                    Long\u2010term electrical stability measurements, including current\/bias stress and aging over 18 months of idle shelf life are presented for GIZO\u2010based TFTs. The effects of oxygen partial pressure, annealing temperature and passivation are discussed. Optimized devices show highly stable properties, such as a recoverable \u0394V\n                    <jats:sub>T<\/jats:sub>\n                    &lt;0.5 V after 24h of I\n                    <jats:sub>D<\/jats:sub>\n                    =10 \u03bcA stress, quite promising for integration in electronic circuits.\n                  <\/jats:p>","DOI":"10.1889\/1.3499958","type":"journal-article","created":{"date-parts":[[2010,10,21]],"date-time":"2010-10-21T09:55:04Z","timestamp":1287654904000},"page":"1376-1379","update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["P\u2010202L:\n                    <i>Late\u2010News Poster<\/i>\n                    : Long\u2010Term Stability of Oxide Semiconductor\u2010 Based TFTs"],"prefix":"10.1002","volume":"41","author":[{"given":"Pedro","family":"Barquinha","sequence":"first","affiliation":[]},{"given":"Luis","family":"Pereira","sequence":"additional","affiliation":[]},{"given":"Gon\u00e7alo","family":"Gon\u00e7alves","sequence":"additional","affiliation":[]},{"given":"Rodrigo","family":"Martins","sequence":"additional","affiliation":[]},{"given":"Elvira","family":"Fortunate","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[2012,7,5]]},"reference":[{"key":"e_1_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1149\/1.3049819"},{"key":"e_1_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.2425020"},{"key":"e_1_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.2824758"},{"key":"e_1_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1149\/1.2178651"},{"key":"e_1_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3167816"},{"key":"e_1_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3187532"},{"key":"e_1_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.2977865"},{"key":"e_1_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.2990657"},{"key":"e_1_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.2783961"},{"key":"e_1_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/24\/1\/015013"},{"key":"e_1_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1016\/0254-0584(96)80115-5"},{"key":"e_1_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.324156"},{"key":"e_1_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1889\/1.3069591"},{"key":"e_1_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1993766"}],"container-title":["SID Symposium Digest of Technical Papers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1889%2F1.3499958","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/sid.onlinelibrary.wiley.com\/doi\/pdf\/10.1889\/1.3499958","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,9]],"date-time":"2025-11-09T10:31:54Z","timestamp":1762684314000},"score":1,"resource":{"primary":{"URL":"https:\/\/sid.onlinelibrary.wiley.com\/doi\/10.1889\/1.3499958"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,5]]},"references-count":14,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2010,5]]}},"alternative-id":["10.1889\/1.3499958"],"URL":"https:\/\/doi.org\/10.1889\/1.3499958","archive":["Portico"],"relation":{},"ISSN":["0097-966X","2168-0159"],"issn-type":[{"type":"print","value":"0097-966X"},{"type":"electronic","value":"2168-0159"}],"subject":[],"published":{"date-parts":[[2010,5]]},"assertion":[{"value":"2012-07-05","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}