{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,27]],"date-time":"2025-05-27T17:10:07Z","timestamp":1748365807722},"reference-count":0,"publisher":"Society for Imaging Science & Technology","issue":"16","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["ei"],"DOI":"10.2352\/ei.2022.34.16.avm-109","type":"journal-article","created":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T07:22:47Z","timestamp":1649402567000},"page":"109-1-109-6","source":"Crossref","is-referenced-by-count":2,"title":["A review of IEEE P2020 noise metrics"],"prefix":"10.2352","volume":"34","author":[{"given":"Orit","family":"Skorka","sequence":"first","affiliation":[]},{"given":"Paul","family":"Romanczyk","sequence":"additional","affiliation":[]}],"member":"1209","published-online":{"date-parts":[[2022,1,16]]},"container-title":["Electronic Imaging"],"original-title":[],"link":[{"URL":"https:\/\/library.imaging.org\/ei\/articles\/34\/16\/AVM-109","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,14]],"date-time":"2022-07-14T12:18:45Z","timestamp":1657801125000},"score":1,"resource":{"primary":{"URL":"https:\/\/library.imaging.org\/ei\/articles\/34\/16\/AVM-109"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,1,16]]},"references-count":0,"journal-issue":{"issue":"16","published-online":{"date-parts":[[2022,1,16]]}},"URL":"https:\/\/doi.org\/10.2352\/ei.2022.34.16.avm-109","relation":{},"ISSN":["2470-1173"],"issn-type":[{"value":"2470-1173","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,1,16]]}}}