{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,7]],"date-time":"2024-07-07T04:34:56Z","timestamp":1720326896848},"reference-count":0,"publisher":"Society for Imaging Science & Technology","issue":"14","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["ei"],"DOI":"10.2352\/issn.2470-1173.2016.14.ipmva-383","type":"journal-article","created":{"date-parts":[[2017,1,26]],"date-time":"2017-01-26T13:14:20Z","timestamp":1485436460000},"page":"1-6","source":"Crossref","is-referenced-by-count":8,"title":["Bit Depth Expansion via Estimation of Bit Value Expectation"],"prefix":"10.2352","volume":"28","author":[{"given":"Jihwan","family":"Woo","sequence":"first","affiliation":[]},{"given":"Seoyoung","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Wonhee","family":"Choe","sequence":"additional","affiliation":[]}],"member":"1209","published-online":{"date-parts":[[2016,2,14]]},"container-title":["Electronic Imaging"],"original-title":[],"link":[{"URL":"https:\/\/library.imaging.org\/ei\/articles\/28\/14\/art00009","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,3,7]],"date-time":"2022-03-07T10:53:59Z","timestamp":1646650439000},"score":1,"resource":{"primary":{"URL":"https:\/\/library.imaging.org\/ei\/articles\/28\/14\/art00009"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,2,14]]},"references-count":0,"journal-issue":{"issue":"14","published-online":{"date-parts":[[2016,2,14]]}},"URL":"https:\/\/doi.org\/10.2352\/issn.2470-1173.2016.14.ipmva-383","relation":{},"ISSN":["2470-1173"],"issn-type":[{"value":"2470-1173","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,2,14]]}}}