{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,14]],"date-time":"2026-01-14T17:15:59Z","timestamp":1768410959800,"version":"3.49.0"},"reference-count":0,"publisher":"Society for Imaging Science & Technology","issue":"7","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["ei"],"DOI":"10.2352\/issn.2470-1173.2018.07.mwsf-160","type":"journal-article","created":{"date-parts":[[2018,9,25]],"date-time":"2018-09-25T14:25:17Z","timestamp":1537885517000},"page":"160-1-160-7","source":"Crossref","is-referenced-by-count":17,"title":["Deep Learning Regressors for Quantitative Steganalysis"],"prefix":"10.2352","volume":"30","author":[{"given":"Mo","family":"Chen","sequence":"first","affiliation":[]},{"given":"Mehdi","family":"Boroumand","sequence":"additional","affiliation":[]},{"given":"Jessica","family":"Fridrich","sequence":"additional","affiliation":[]}],"member":"1209","published-online":{"date-parts":[[2018,1,28]]},"container-title":["Electronic Imaging"],"original-title":[],"link":[{"URL":"https:\/\/library.imaging.org\/ei\/articles\/30\/7\/art00008","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,3,7]],"date-time":"2022-03-07T12:01:27Z","timestamp":1646654487000},"score":1,"resource":{"primary":{"URL":"https:\/\/library.imaging.org\/ei\/articles\/30\/7\/art00008"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,1,28]]},"references-count":0,"journal-issue":{"issue":"7","published-online":{"date-parts":[[2018,1,28]]}},"URL":"https:\/\/doi.org\/10.2352\/issn.2470-1173.2018.07.mwsf-160","relation":{},"ISSN":["2470-1173"],"issn-type":[{"value":"2470-1173","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,1,28]]}}}