{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,29]],"date-time":"2022-03-29T22:28:17Z","timestamp":1648592897584},"reference-count":0,"publisher":"Society for Imaging Science & Technology","issue":"6","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["ei"],"DOI":"10.2352\/issn.2470-1173.2019.6.maap-477","type":"journal-article","created":{"date-parts":[[2019,9,28]],"date-time":"2019-09-28T05:29:06Z","timestamp":1569648546000},"page":"477-1-477-7","source":"Crossref","is-referenced-by-count":0,"title":["Comparative analysis of transmittance measurement geometries and apparatus"],"prefix":"10.2352","volume":"31","author":[{"given":"Marjan","family":"Shahpaski","sequence":"first","affiliation":[]},{"given":"Luis Ricardo","family":"Sapaico","sequence":"additional","affiliation":[]},{"given":"Sabine","family":"S\u00fcsstrunk","sequence":"additional","affiliation":[]}],"member":"1209","published-online":{"date-parts":[[2019,1,13]]},"container-title":["Electronic Imaging"],"original-title":[],"link":[{"URL":"https:\/\/library.imaging.org\/ei\/articles\/31\/6\/art00006","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,3,7]],"date-time":"2022-03-07T12:25:14Z","timestamp":1646655914000},"score":1,"resource":{"primary":{"URL":"https:\/\/library.imaging.org\/ei\/articles\/31\/6\/art00006"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,1,13]]},"references-count":0,"journal-issue":{"issue":"6","published-online":{"date-parts":[[2019,1,13]]}},"URL":"https:\/\/doi.org\/10.2352\/issn.2470-1173.2019.6.maap-477","relation":{},"ISSN":["2470-1173"],"issn-type":[{"value":"2470-1173","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,1,13]]}}}