{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,17]],"date-time":"2025-10-17T13:56:02Z","timestamp":1760709362339,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.23919\/acc.2017.7962954","type":"proceedings-article","created":{"date-parts":[[2017,7,10]],"date-time":"2017-07-10T21:39:58Z","timestamp":1499722798000},"page":"204-209","source":"Crossref","is-referenced-by-count":11,"title":["Stability analysis of a Scanning Tunneling Microscope control system"],"prefix":"10.23919","author":[{"given":"Farid","family":"Tajaddodianfar","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S. O. Reza","family":"Moheimani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ehud","family":"Fuchs","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"John N.","family":"Randall","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"year":"0","article-title":"ZyVector|STM LITHOGRAPHY CONTROL SYSTEM","key":"ref10"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1063\/1.1140047"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/S0005-1098(99)00022-9"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1016\/j.automatica.2014.12.038"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1016\/j.automatica.2014.05.001"},{"key":"ref15","first-page":"54","article-title":"Frequency-domain closed-loop system identification of a scanning tunneling microscope","author":"tajaddodianfar","year":"2016","journal-title":"ASPE 2016 Spring Topical Meeting Precision Mechatronic System Design and Control"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1063\/1.1145551"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1116\/1.4823756"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1088\/0957-0233\/8\/5\/006"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1063\/1.1149191"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1016\/j.conengprac.2012.02.010"},{"key":"ref7","first-page":"6058","article-title":"H-infinity controller design for high-performance scanning tunneling microscope","author":"ahmad","year":"2009","journal-title":"Proceedings of the 48h IEEE Conference on Decision and Control (CDC) Held Jointly with 2009 28th Chinese Control Conference"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1088\/0957-4484\/25\/14\/145302"},{"key":"ref1","first-page":"355","article-title":"Scanning tunneling microscopy","volume":"30","author":"binnig","year":"1986","journal-title":"IBM J Res Dev"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TIE.2004.825266"}],"event":{"name":"2017 American Control Conference (ACC)","start":{"date-parts":[[2017,5,24]]},"location":"Seattle, WA, USA","end":{"date-parts":[[2017,5,26]]}},"container-title":["2017 American Control Conference (ACC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7951530\/7962914\/07962954.pdf?arnumber=7962954","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,6,23]],"date-time":"2021-06-23T20:01:41Z","timestamp":1624478501000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7962954\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":15,"URL":"https:\/\/doi.org\/10.23919\/acc.2017.7962954","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}