{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,31]],"date-time":"2024-10-31T02:23:41Z","timestamp":1730341421098,"version":"3.28.0"},"reference-count":27,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.23919\/acc.2017.7963482","type":"proceedings-article","created":{"date-parts":[[2017,7,10]],"date-time":"2017-07-10T21:39:58Z","timestamp":1499722798000},"page":"3463-3469","source":"Crossref","is-referenced-by-count":3,"title":["Dynamic temperature estimation of power electronics systems"],"prefix":"10.23919","author":[{"given":"Pamela J.","family":"Tannous","sequence":"first","affiliation":[]},{"given":"Satya R. T.","family":"Peddada","sequence":"additional","affiliation":[]},{"given":"James T.","family":"Allison","sequence":"additional","affiliation":[]},{"given":"Thomas","family":"Foulkes","sequence":"additional","affiliation":[]},{"given":"Robert C.N.","family":"Pilawa-Podgurski","sequence":"additional","affiliation":[]},{"given":"Andrew G.","family":"Alleyne","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"1982","author":"atherton","journal-title":"Nonlinear Control Engineering","key":"ref10"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/ISQED.2008.4479714"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/61.915478"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/HPCA.2002.995695"},{"key":"ref14","article-title":"Pulsed Thermography Simulation: 1D, 2D and 3D Electro-Thermal Model Based Evaluation","author":"jena","year":"2006","journal-title":"Simulation"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/TAC.1981.1102568"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"1115","DOI":"10.1080\/00207178408933239","article-title":"All optimal Hankel-norm approximations of linear multivariable systems and their L, ? -error bounds","volume":"39","author":"glover","year":"1984","journal-title":"Int J Control"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1007\/978-3-540-78841-6_1"},{"key":"ref18","first-page":"5118","article-title":"Building Thermal Model Reduction via Aggregation of States","author":"deng","year":"2010","journal-title":"Am Control Conf"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1016\/j.automatica.2014.02.009"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/ISCAS.2010.5537347"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1109\/ACC.2015.7170752"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/DATE.2007.364540"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TCPMT.2014.2353695"},{"key":"ref5","first-page":"517","article-title":"A thermal-aware superscalar microprocessor","volume":"2002 janua","author":"lim","year":"2002","journal-title":"Proc - Int Symp Qual Electron Des ISQED"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/ICCD.2008.4751897"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TCAD.2010.2061310"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TVLSI.2006.876103"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1145\/1837274.1837293"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/JPROC.2006.879797"},{"key":"ref20","first-page":"191","article-title":"Sensor Placement for Optimal Kalman Filtering: Fundamental Limits, Submodularity, and Algorithms","author":"tzoumas","year":"2015"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/TPEL.2017.2650140"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1007\/978-3-540-70991-6"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/ACC.2005.1469922"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1021\/ie040212v"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1016\/j.vlsi.2011.12.003"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1021\/ie070547n"}],"event":{"name":"2017 American Control Conference (ACC)","start":{"date-parts":[[2017,5,24]]},"location":"Seattle, WA, USA","end":{"date-parts":[[2017,5,26]]}},"container-title":["2017 American Control Conference (ACC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7951530\/7962914\/07963482.pdf?arnumber=7963482","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,6,23]],"date-time":"2021-06-23T20:02:03Z","timestamp":1624478523000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7963482\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":27,"URL":"https:\/\/doi.org\/10.23919\/acc.2017.7963482","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}