{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,29]],"date-time":"2026-05-29T22:29:15Z","timestamp":1780093755564,"version":"3.54.0"},"reference-count":26,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,6]]},"DOI":"10.23919\/acc.2018.8431873","type":"proceedings-article","created":{"date-parts":[[2018,8,17]],"date-time":"2018-08-17T20:16:10Z","timestamp":1534536970000},"page":"6037-6042","source":"Crossref","is-referenced-by-count":9,"title":["Hardware Demonstration of Atomic Force Microscopy Imaging Via Compressive Sensing and <tex>$\\mu$<\/tex>-Path Scans"],"prefix":"10.23919","author":[{"given":"Roger A.","family":"Braker","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yufan","family":"Luo","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lucy Y.","family":"Pao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sean B.","family":"Andersson","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/23\/18\/185501"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2014.2309653"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2010.04.016"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/S1369-7021(09)70006-9"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.4881682"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.23919\/ACC.2017.7963046"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/NANO.2011.6144587"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2012.6315406"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/26\/50\/505703"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.4172\/2169-0022.S1.006"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CCA.2011.6044387"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2011.2105499"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2008.2001186"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.2403839"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2015.2394327"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MCS.2008.930922"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2007.902953"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/20\/36\/365503"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2007.4282300"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2016.09.011"},{"key":"ref22","first-page":"281","author":"carmi","year":"2014","journal-title":"Compressive System Identification"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2014.6858710"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"key":"ref23","first-page":"3503","article-title":"A fast image reconstruction algorithm for compressed sensing-based atomic force microscopy","author":"luo","year":"2015","journal-title":"Proc American Control Conf"},{"key":"ref26","first-page":"1","article-title":"A comparison of scanning methods and the vertical control implications for scanning probe microscopy","volume":"19","author":"teo","year":"2017","journal-title":"Asian Journal of Control"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/MCS.2007.914688"}],"event":{"name":"2018 Annual American Control Conference (ACC)","location":"Milwaukee, WI, USA","start":{"date-parts":[[2018,6,27]]},"end":{"date-parts":[[2018,6,29]]}},"container-title":["2018 Annual American Control Conference (ACC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8410068\/8430677\/08431873.pdf?arnumber=8431873","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T00:01:38Z","timestamp":1598227298000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8431873\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,6]]},"references-count":26,"URL":"https:\/\/doi.org\/10.23919\/acc.2018.8431873","relation":{},"subject":[],"published":{"date-parts":[[2018,6]]}}}