{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T06:15:46Z","timestamp":1725776146462},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,7]]},"DOI":"10.23919\/acc45564.2020.9147204","type":"proceedings-article","created":{"date-parts":[[2020,7,27]],"date-time":"2020-07-27T22:02:33Z","timestamp":1595887353000},"page":"3188-3192","source":"Crossref","is-referenced-by-count":2,"title":["A Nonlinear Fault Detection Scheme for PV Applications"],"prefix":"10.23919","author":[{"given":"Nicholas","family":"Hawkins","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nicholas","family":"Jewell","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Moath","family":"Alqatamin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bhagyashri","family":"Bhagwat","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael","family":"McIntyre","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/NAPS.2014.6965470"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2015.2421447"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ROBOT.2004.1302507"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2017.2695606"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2017.8096726"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2014.2364956"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/PVSC.2014.6925661"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOTOV.2015.2397599"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2015.7280498"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/COMPEL.2016.7556716"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2260512"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IESES.2018.8349902"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CPE.2018.8372609"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2755592"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2226059"}],"event":{"name":"2020 American Control Conference (ACC)","start":{"date-parts":[[2020,7,1]]},"location":"Denver, CO, USA","end":{"date-parts":[[2020,7,3]]}},"container-title":["2020 American Control Conference (ACC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9140048\/9147203\/09147204.pdf?arnumber=9147204","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,31]],"date-time":"2020-08-31T21:47:47Z","timestamp":1598910467000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9147204\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,7]]},"references-count":15,"URL":"https:\/\/doi.org\/10.23919\/acc45564.2020.9147204","relation":{},"subject":[],"published":{"date-parts":[[2020,7]]}}}