{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,14]],"date-time":"2026-04-14T10:01:04Z","timestamp":1776160864819,"version":"3.50.1"},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,6,8]],"date-time":"2022-06-08T00:00:00Z","timestamp":1654646400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,6,8]],"date-time":"2022-06-08T00:00:00Z","timestamp":1654646400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,6,8]]},"DOI":"10.23919\/acc53348.2022.9867647","type":"proceedings-article","created":{"date-parts":[[2022,9,5]],"date-time":"2022-09-05T20:24:10Z","timestamp":1662409450000},"page":"3365-3365","source":"Crossref","is-referenced-by-count":2,"title":["Real-Sim: A Multi-resolution X-in-the-loop Experimental Approach for Testing Connected and Automated Vehicles"],"prefix":"10.23919","author":[{"given":"Yunli","family":"Shao","sequence":"first","affiliation":[]},{"given":"Adian","family":"Cook","sequence":"additional","affiliation":[]},{"given":"Nolan","family":"Perry","sequence":"additional","affiliation":[]},{"given":"Dean","family":"Deter","sequence":"additional","affiliation":[]},{"given":"Chieh Ross","family":"Wang","sequence":"additional","affiliation":[]}],"member":"263","event":{"name":"2022 American Control Conference (ACC)","location":"Atlanta, GA, USA","start":{"date-parts":[[2022,6,8]]},"end":{"date-parts":[[2022,6,10]]}},"container-title":["2022 American Control Conference (ACC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9866948\/9867142\/09867647.pdf?arnumber=9867647","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,9,5]],"date-time":"2022-09-05T20:27:31Z","timestamp":1662409651000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9867647\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,6,8]]},"references-count":0,"URL":"https:\/\/doi.org\/10.23919\/acc53348.2022.9867647","relation":{},"subject":[],"published":{"date-parts":[[2022,6,8]]}}}