{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T00:24:56Z","timestamp":1725755096650},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,7,10]],"date-time":"2024-07-10T00:00:00Z","timestamp":1720569600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,7,10]],"date-time":"2024-07-10T00:00:00Z","timestamp":1720569600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,7,10]]},"DOI":"10.23919\/acc60939.2024.10644756","type":"proceedings-article","created":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T17:56:19Z","timestamp":1725558979000},"page":"1506-1511","source":"Crossref","is-referenced-by-count":0,"title":["Dual-Stream Cross-Modal Feature Fusion Based on Multi-Scale Attention for Industrial Fault Diagnosis"],"prefix":"10.23919","author":[{"given":"Penglong","family":"Lian","sequence":"first","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,Sichuan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Penghui","family":"Shang","sequence":"additional","affiliation":[{"name":"Zhiyuan Research Institute,Hangzhou,Zhejiang,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiyang","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,Sichuan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhiheng","family":"Su","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu,Sichuan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jianxiao","family":"Zou","sequence":"additional","affiliation":[{"name":"Shenzhen Institute for Advanced Study and School of Automation Engineering, University of Electronic Science and Technology of China (UESTC),China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shicai","family":"Fan","sequence":"additional","affiliation":[{"name":"Shenzhen Institute for Advanced Study and School of Automation Engineering, University of Electronic Science and Technology of China (UESTC),China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.112346"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2019.106587"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2022.108900"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2844805"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.108017"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s42417-022-00498-9"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/coatings12060866"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2020.2991296"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/YAC51587.2020.9337689"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2020.10.005"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.450"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2017.02.003"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2022.108567"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICSMD57530.2022.10058404"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111594"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ac93a5"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW.2019.00064"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3934\/mbe.2022656"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/WACV48630.2021.00360"},{"volume-title":"Case Western Reserve University Bearing Data Center Website","key":"ref20"}],"event":{"name":"2024 American Control Conference (ACC)","start":{"date-parts":[[2024,7,10]]},"location":"Toronto, ON, Canada","end":{"date-parts":[[2024,7,12]]}},"container-title":["2024 American Control Conference (ACC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10644130\/10644150\/10644756.pdf?arnumber=10644756","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T07:20:26Z","timestamp":1725693626000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10644756\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,7,10]]},"references-count":20,"URL":"https:\/\/doi.org\/10.23919\/acc60939.2024.10644756","relation":{},"subject":[],"published":{"date-parts":[[2024,7,10]]}}}