{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T06:07:57Z","timestamp":1725602877694},"reference-count":30,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T00:00:00Z","timestamp":1658102400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T00:00:00Z","timestamp":1658102400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,7,18]]},"DOI":"10.23919\/annsim55834.2022.9859501","type":"proceedings-article","created":{"date-parts":[[2022,8,23]],"date-time":"2022-08-23T15:52:45Z","timestamp":1661269965000},"page":"258-269","source":"Crossref","is-referenced-by-count":0,"title":["Analysis Of The Impact Of Cyber Attack On Semiconductor Manufacturing Energy Quantification"],"prefix":"10.23919","author":[{"given":"Busra","family":"Ezici","sequence":"first","affiliation":[{"name":"George Mason University, 4400 University Dr,Systems Engineering and Operations Research,Fairfax,VA,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paulo","family":"Costa","sequence":"additional","affiliation":[{"name":"George Mason University, 4400 University Dr,Systems Engineering and Operations Research,Fairfax,VA,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jie","family":"Xu","sequence":"additional","affiliation":[{"name":"George Mason University, 4400 University Dr,Systems Engineering and Operations Research,Fairfax,VA,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2020.103201"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3745\/JIPS.2011.7.4.561"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/nem.2060"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1093\/ijlct\/ctz041"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1186\/s13635-020-00111-0"},{"journal-title":"Capacity Model with Sustainability Scope to Predict the Semiconductor Manufacturing&#x2019;s Energy Consumption and Carbon Dioxide Emissions","year":"2018","author":"kannaian","key":"ref14"},{"journal-title":"Intel Five-Machine Six Step Mini-Fab Description","year":"0","author":"kempf","key":"ref15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.51593\/20190016"},{"journal-title":"Dragonstone Strategy &#x2013; State of Cybersecurity in the Oil & Natural Gas Sector","year":"2020","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.6028\/NIST.IR.7236"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/WSC.2011.6148055"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.5585\/exactaep.v13n2.5850"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.promfg.2018.07.148"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/electronics9111864"},{"journal-title":"Assessing the Impact of Cyber-Threats on Smart Manufacturing Systems through a Simulation Study","year":"2017","author":"avila","key":"ref3"},{"journal-title":"IE 4803 Intel Mini Fab Case Study - Model-Based Systems Engineering and the Intel MiniFab Case Leon","year":"2021","key":"ref6"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/WSC48552.2020.9383873"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/s18092796"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/COGSIMA.2017.7929597"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s41635-017-0029-7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.softx.2020.100576"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-57870-5_16"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.future.2018.04.051"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/WSC.2005.1574444"},{"key":"ref22","first-page":"58","article-title":"Semiconductors: U.S. Industry, Global Competition, and Federal Policy","author":"platzer","year":"2020","journal-title":"Global Competition"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/s19092148"},{"key":"ref24","first-page":"1","article-title":"Cybersecurity in Big Data Era: From Securing Big Data to Data-Driven Security","author":"rawat","year":"2019","journal-title":"IEEE Transactions on Services Computing"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3390\/app9235105"},{"key":"ref26","first-page":"103","author":"shinde","year":"2018","journal-title":"Modeling and Simulation of Semiconductor Manufacturing Fab for Cycle Time Analysis"},{"key":"ref25","doi-asserted-by":"crossref","first-page":"1481","DOI":"10.1109\/WSC.2000.899129","article-title":"General Simulation Applications in Semiconductor Manufacturing: Why do simple wafer fab models fail in certain scenarios?","author":"rose","year":"2000","journal-title":"In Proceedings of the 32nd conference on Winter simulation WSC &#x2019;00"}],"event":{"name":"2022 Annual Modeling and Simulation Conference (ANNSIM)","start":{"date-parts":[[2022,7,18]]},"location":"San Diego, CA, USA","end":{"date-parts":[[2022,7,20]]}},"container-title":["2022 Annual Modeling and Simulation Conference (ANNSIM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9859263\/9859270\/09859501.pdf?arnumber=9859501","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,9,12]],"date-time":"2022-09-12T16:02:21Z","timestamp":1662998541000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9859501\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,7,18]]},"references-count":30,"URL":"https:\/\/doi.org\/10.23919\/annsim55834.2022.9859501","relation":{},"subject":[],"published":{"date-parts":[[2022,7,18]]}}}