{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T00:11:52Z","timestamp":1725754312806},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,3]]},"DOI":"10.23919\/date.2017.7927022","type":"proceedings-article","created":{"date-parts":[[2017,5,15]],"date-time":"2017-05-15T16:34:41Z","timestamp":1494866081000},"page":"392-397","source":"Crossref","is-referenced-by-count":19,"title":["Cost-effective analysis of post-silicon functional coverage events"],"prefix":"10.23919","author":[{"given":"Farimah","family":"Farahmandi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ronny","family":"Morad","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Avi","family":"Ziv","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ziv","family":"Nevo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Prabhat","family":"Mishra","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"1351","article-title":"Automated Test Generation for Debugging Arithmetic Circuits","author":"farimah farahmandi","year":"2016","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TVLSI.2012.2192457"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.7873\/DATE.2013.111"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/ICCAD.2015.7372542"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1145\/1297666.1297670"},{"key":"ref15","article-title":"Towards coverage closure: Using goldmine assertions for generating design validation stimulus","author":"liu","year":"2011","journal-title":"DATE"},{"key":"ref16","first-page":"1369","article-title":"Combinational Trace Signal Selection with Improved State Restoration for Post-Silicon Debug","author":"siamack beigmohammadi","year":"2016","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"ref17","article-title":"Reaching Coverage Closure in Post-Silicon Validation","author":"adir","year":"2010","journal-title":"HVC"},{"year":"2012","author":"chen","journal-title":"System-LeveL Validation High-Level Modeling and Directed Test Generation Techniques","key":"ref4"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/DATE.2011.5763252"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TC.2012.163"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.3850\/9783981537079_0808"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.7873\/DATE.2015.0605"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/ICCD.2006.4380831"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1145\/2024724.2024916"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1145\/1837274.1837280"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TVLSI.2015.2396083"}],"event":{"name":"2017 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2017,3,27]]},"location":"Lausanne, Switzerland","end":{"date-parts":[[2017,3,31]]}},"container-title":["Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7919927\/7926947\/07927022.pdf?arnumber=7927022","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,12,13]],"date-time":"2017-12-13T15:44:30Z","timestamp":1513179870000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7927022\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,3]]},"references-count":17,"URL":"https:\/\/doi.org\/10.23919\/date.2017.7927022","relation":{},"subject":[],"published":{"date-parts":[[2017,3]]}}}