{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T17:49:19Z","timestamp":1725558559397},"reference-count":30,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,3]]},"DOI":"10.23919\/date.2017.7927027","type":"proceedings-article","created":{"date-parts":[[2017,5,15]],"date-time":"2017-05-15T16:34:41Z","timestamp":1494866081000},"page":"422-427","source":"Crossref","is-referenced-by-count":4,"title":["Fast and waveform-accurate hazard-aware SAT-based TSOF ATPG"],"prefix":"10.23919","author":[{"given":"Jan","family":"Burchard","sequence":"first","affiliation":[]},{"given":"Dominik","family":"Erb","sequence":"additional","affiliation":[]},{"given":"Adit D.","family":"Singh","sequence":"additional","affiliation":[]},{"given":"Sudhakar M.","family":"Reddy","sequence":"additional","affiliation":[]},{"given":"Bernd","family":"Becker","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2015.73"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1983.1585625"},{"key":"ref11","article-title":"On testing stuck-open faults","author":"chandramouli","year":"1983","journal-title":"Symposium on Fault-Tolerant Computing"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2006.8"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2013.43"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2014.6818740"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1983.1585627"},{"key":"ref16","first-page":"435","article-title":"On testable design for CMOS logic circuits","author":"reddy","year":"1983","journal-title":"Proc 1983 International Test Conference"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1986.1676825"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1987.295148"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1988.5323"},{"journal-title":"Antom","year":"2016","author":"schubert","key":"ref28"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1978.tb02106.x"},{"key":"ref27","article-title":"IWLS 2005 benchmarks","author":"albrecht","year":"2005","journal-title":"International Workshop on Logic Synthesis"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2014.6847814"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2015.7342382"},{"key":"ref29","article-title":"An enhancement to lssd and some applications of lssd in reliability, availability and serviceability","author":"dasgupta","year":"1981","journal-title":"Symposium on Fault-Tolerant Computing"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2015.7116301"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1984.1585845"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1988.207853"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401533"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1981.1585380"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2323216"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1989.82334"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/321203.321214"},{"key":"ref21","first-page":"44","article-title":"Robust tests for stuck-open faults in CMOS combinational logic circuits","author":"reddy","year":"1984","journal-title":"Fault-Tolerant Computing FTCS-14"},{"key":"ref24","article-title":"On the Complexity of Derivation in Propositional Calculus","author":"tseitin","year":"1968","journal-title":"Studies in Constructive Mathematics and Mathematical Logic"},{"journal-title":"NanGate FreePDK45 generic open cell library v1 3","year":"0","key":"ref23"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/54.867894"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/2429384.2429391"}],"event":{"name":"2017 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2017,3,27]]},"location":"Lausanne, Switzerland","end":{"date-parts":[[2017,3,31]]}},"container-title":["Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7919927\/7926947\/07927027.pdf?arnumber=7927027","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,5,31]],"date-time":"2017-05-31T00:16:40Z","timestamp":1496189800000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7927027\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,3]]},"references-count":30,"URL":"https:\/\/doi.org\/10.23919\/date.2017.7927027","relation":{},"subject":[],"published":{"date-parts":[[2017,3]]}}}