{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T23:31:59Z","timestamp":1725492719056},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,3]]},"DOI":"10.23919\/date.2017.7927059","type":"proceedings-article","created":{"date-parts":[[2017,5,15]],"date-time":"2017-05-15T20:34:41Z","timestamp":1494880481000},"page":"610-613","source":"Crossref","is-referenced-by-count":3,"title":["Enabling area efficient RF ICs through monolithic 3D integration"],"prefix":"10.23919","author":[{"given":"Panagiotis","family":"Chaourani","sequence":"first","affiliation":[]},{"given":"Per-Erik","family":"Hellstrcom","sequence":"additional","affiliation":[]},{"given":"Saul","family":"Rodriguez","sequence":"additional","affiliation":[]},{"given":"Raul","family":"Onet","sequence":"additional","affiliation":[]},{"given":"Ana","family":"Rusu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2458336"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2009.5166294"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2008.4523211"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2307201"},{"key":"ref4","article-title":"Modified ELTRAN® A game changer for Monolithic 3D","author":"or-bach","year":"2015","journal-title":"S3S"},{"key":"ref3","first-page":"1197","article-title":"Monolithic 3D Integration: A Path From Concept To Reality","author":"shulaker","year":"2014","journal-title":"DATE"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2012.6187545"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2011.5722210"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2014.6948770"},{"key":"ref7","article-title":"The Monolithic 3D Advantage","author":"or-bach","year":"2013","journal-title":"3DIC"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/S3S.2014.7028243"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2012.2223593"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2458339"}],"event":{"name":"2017 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2017,3,27]]},"location":"Lausanne, Switzerland","end":{"date-parts":[[2017,3,31]]}},"container-title":["Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7919927\/7926947\/07927059.pdf?arnumber=7927059","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,5,31]],"date-time":"2017-05-31T04:24:47Z","timestamp":1496204687000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7927059\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,3]]},"references-count":13,"URL":"https:\/\/doi.org\/10.23919\/date.2017.7927059","relation":{},"subject":[],"published":{"date-parts":[[2017,3]]}}}