{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:43:24Z","timestamp":1750308204601,"version":"3.41.0"},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,3]]},"DOI":"10.23919\/date.2017.7927170","type":"proceedings-article","created":{"date-parts":[[2017,5,15]],"date-time":"2017-05-15T20:34:41Z","timestamp":1494880481000},"page":"1195-1200","source":"Crossref","is-referenced-by-count":3,"title":["Subgradient based multiple-starting-point algorithm for non-smooth optimization of analog circuits"],"prefix":"10.23919","author":[{"given":"Wenlong","family":"Lv","sequence":"first","affiliation":[]},{"given":"Fan","family":"Yang","sequence":"additional","affiliation":[]},{"given":"Changhao","family":"Yan","sequence":"additional","affiliation":[]},{"given":"Dian","family":"Zhou","sequence":"additional","affiliation":[]},{"given":"Xuan","family":"Zeng","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ASICON.2013.6811900"},{"journal-title":"On-chip benchmarking and calibration without external references","year":"2011","author":"lee","key":"ref11"},{"key":"ref12","volume":"374","author":"hogervorst","year":"2013","journal-title":"Design of Low-Voltage Low-Power Operational Amplifier Cells"},{"journal-title":"Logsumexp - wikipedia the free encyclopedia","year":"0","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1997.621412"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1017\/S0962492900002518"},{"key":"ref16","first-page":"1","article-title":"Nonsmooth optimization via BFGS","author":"lewis","year":"2009","journal-title":"SIAM J Optimiz"},{"key":"ref17","first-page":"1","article-title":"Subgradients","author":"boyd","year":"2008","journal-title":"Notes for EE364b"},{"key":"ref18","first-page":"1","article-title":"Subgradient methods","volume":"1","author":"boyd","year":"2003","journal-title":"lecture notes of EE392o Stanford …"},{"journal-title":"Numerical Optimization","year":"2006","author":"nocedal","key":"ref19"},{"key":"ref4","first-page":"1423","article-title":"PolyGP: Improving GP-Based Analog Optimization through Accurate High-Order Monomials and Semidefinite Relaxation","author":"ye wang","year":"2016","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"journal-title":"Posynomial - wikipedia the free encyclopedia","year":"0","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cds:20000770"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"108","DOI":"10.1007\/BF00047572","article-title":"Simulated annealing: theory and applications","volume":"12","author":"hwang","year":"1988","journal-title":"Acta Applicandae Mathematicae"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008202821328"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.aeue.2012.01.003"},{"key":"ref2","first-page":"298","article-title":"Analog circuit design via geometric programming","author":"hershenson","year":"2004","journal-title":"IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.810742"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2012.2226504"},{"key":"ref20","volume":"3","author":"shor","year":"2012","journal-title":"Minimization Methods for Non-Differentiable Functions"},{"journal-title":"Penalty functions and constrained optimization","year":"2005","author":"bryan","key":"ref22"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008739111712"},{"key":"ref24","first-page":"1417","article-title":"Efficient Multiple Starting Point Optimization for Automated Analog Circuit Optimization via Recycling Simulation Data","author":"bo peng","year":"2016","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2229070"}],"event":{"name":"2017 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2017,3,27]]},"location":"Lausanne, Switzerland","end":{"date-parts":[[2017,3,31]]}},"container-title":["Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7919927\/7926947\/07927170.pdf?arnumber=7927170","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T16:27:38Z","timestamp":1750264058000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7927170\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,3]]},"references-count":24,"URL":"https:\/\/doi.org\/10.23919\/date.2017.7927170","relation":{},"subject":[],"published":{"date-parts":[[2017,3]]}}}