{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T17:46:50Z","timestamp":1729619210052,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.23919\/date.2018.8342024","type":"proceedings-article","created":{"date-parts":[[2018,4,23]],"date-time":"2018-04-23T23:20:11Z","timestamp":1524525611000},"page":"297-300","source":"Crossref","is-referenced-by-count":2,"title":["A Boolean model for delay fault testing of emerging digital technologies based on ambipolar devices"],"prefix":"10.23919","author":[{"given":"Marcello","family":"Dalpasso","sequence":"first","affiliation":[]},{"given":"Davide","family":"Bertozzi","sequence":"additional","affiliation":[]},{"given":"Michele","family":"Favalli","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"1","DOI":"10.3233\/SAT190014","article-title":"Translating Pseudo-Boolean Constraints into SAT","volume":"2","author":"een","year":"2006","journal-title":"J Satisfiability Boolean Model Comput"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-74970-7_38"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1987.295104"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/43.46805"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639714"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805628"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2005.851427"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2012.6479004"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2085250"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373592"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.0428"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2015.2460377"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JXCDC.2015.2418033"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.4313\/TEEM.2010.11.3.093"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-014-5433-0"}],"event":{"name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2018,3,19]]},"location":"Dresden, Germany","end":{"date-parts":[[2018,3,23]]}},"container-title":["2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8337149\/8341968\/08342024.pdf?arnumber=8342024","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T06:43:07Z","timestamp":1604212987000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8342024\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":15,"URL":"https:\/\/doi.org\/10.23919\/date.2018.8342024","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}