{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T12:00:06Z","timestamp":1725537606279},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.23919\/date.2018.8342028","type":"proceedings-article","created":{"date-parts":[[2018,4,23]],"date-time":"2018-04-23T19:20:11Z","timestamp":1524511211000},"page":"315-318","source":"Crossref","is-referenced-by-count":2,"title":["SAT-based redundancy removal"],"prefix":"10.23919","author":[{"given":"Krishanu","family":"Debnath","sequence":"first","affiliation":[]},{"given":"Rajeev","family":"Murgai","sequence":"additional","affiliation":[]},{"given":"Mayank","family":"Jain","sequence":"additional","affiliation":[]},{"given":"Janet","family":"Olson","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1145\/378239.378470"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/DATE.2002.998262"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/ICCD.1992.276282"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/ICCAD.1996.569607"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/43.536723"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/43.108614"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1145\/378239.379017"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1002\/j.1538-7305.1956.tb03835.x"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TC.1981.1675757"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1147\/rd.104.0278"},{"key":"ref1","article-title":"Combining Strengths of Circuit-based and CNF-based Algorithms for a High-Performance SAT Solver","author":"ganai","year":"2002","journal-title":"DAC"}],"event":{"name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2018,3,19]]},"location":"Dresden, Germany","end":{"date-parts":[[2018,3,23]]}},"container-title":["2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8337149\/8341968\/08342028.pdf?arnumber=8342028","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,5,4]],"date-time":"2018-05-04T11:09:57Z","timestamp":1525432197000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8342028\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":11,"URL":"https:\/\/doi.org\/10.23919\/date.2018.8342028","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}