{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T03:12:19Z","timestamp":1725419539512},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.23919\/date.2018.8342036","type":"proceedings-article","created":{"date-parts":[[2018,4,23]],"date-time":"2018-04-23T23:20:11Z","timestamp":1524525611000},"page":"361-366","source":"Crossref","is-referenced-by-count":1,"title":["Bayesian theory based switching probability calculation method of critical timing path for on-chip timing slack monitoring"],"prefix":"10.23919","author":[{"given":"Byung Su","family":"Kim","sequence":"first","affiliation":[]},{"given":"Joon-Sung","family":"Yang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/BF01581047"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/321906.321909"},{"journal-title":"Oklahoma State University System on Chip (SoC) Design Flows","year":"0","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2027567"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2012.6187559"},{"key":"ref3","article-title":"Adaptive Clocking in the POWER9TM Processor for Voltage Droop Protection","author":"floyd","year":"0","journal-title":"2017 IEEE ISSCC"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2010.2067810"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373462"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007145"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2014.2"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837371"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.070"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1093\/nar\/30.7.1575"}],"event":{"name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2018,3,19]]},"location":"Dresden","end":{"date-parts":[[2018,3,23]]}},"container-title":["2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8337149\/8341968\/08342036.pdf?arnumber=8342036","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,5,29]],"date-time":"2018-05-29T00:02:59Z","timestamp":1527552179000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8342036\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":13,"URL":"https:\/\/doi.org\/10.23919\/date.2018.8342036","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}