{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,5]],"date-time":"2025-06-05T13:04:20Z","timestamp":1749128660681},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.23919\/date.2018.8342081","type":"proceedings-article","created":{"date-parts":[[2018,4,23]],"date-time":"2018-04-23T23:20:11Z","timestamp":1524525611000},"page":"609-612","source":"Crossref","is-referenced-by-count":9,"title":["ETISS-ML: A multi-level instruction set simulator with RTL-level fault injection support for the evaluation of cross-layer resiliency techniques"],"prefix":"10.23919","author":[{"given":"Daniel","family":"Mueller-Gritschneder","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Martin","family":"Dittrich","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Josef","family":"Weinzierl","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eric","family":"Cheng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Subhasish","family":"Mitra","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ulf","family":"Schlichtmann","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/24.994913"},{"journal-title":"Introduction to Verilator","year":"2017","author":"snyder","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1250662.1250719"},{"key":"ref13","article-title":"A cross-layer technology-based study of how memory errors impact system resilience","author":"wehn","year":"2013","journal-title":"IEEE Micro"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CODESISSS.2015.7331384"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488859"},{"key":"ref6","article-title":"A virtual fault injection framework for reliability-aware software development","author":"h\u00f6ller","year":"2015","journal-title":"Dependable Systems and Networks Workshops"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2744798"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3130265.3138858"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2009.4798242"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2897996"},{"journal-title":"Openrisc 1000 architecture manual v1 1","year":"2014","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2602976"}],"event":{"name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2018,3,19]]},"location":"Dresden","end":{"date-parts":[[2018,3,23]]}},"container-title":["2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8337149\/8341968\/08342081.pdf?arnumber=8342081","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,5,29]],"date-time":"2018-05-29T00:03:08Z","timestamp":1527552188000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8342081\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":13,"URL":"https:\/\/doi.org\/10.23919\/date.2018.8342081","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}