{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,31]],"date-time":"2024-10-31T02:45:49Z","timestamp":1730342749189,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.23919\/date.2018.8342082","type":"proceedings-article","created":{"date-parts":[[2018,4,23]],"date-time":"2018-04-23T19:20:11Z","timestamp":1524511211000},"page":"613-616","source":"Crossref","is-referenced-by-count":5,"title":["Precise evaluation of the fault sensitivity of OoO superscalar processors"],"prefix":"10.23919","author":[{"given":"Rafael Billig","family":"Tonetto","sequence":"first","affiliation":[]},{"given":"Gabriel L.","family":"Nazar","sequence":"additional","affiliation":[]},{"given":"Antonio Carlos Schneider","family":"Beck","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2016.7500787"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IISWC.2015.28"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DSN-W.2017.16"},{"journal-title":"The berkeley out-of-order machine (boom) An industry-competitive synthesizable parameterized risc-v processor","year":"2015","author":"celio","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228584"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2016.7482075"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253181"},{"key":"ref3","first-page":"245","article-title":"Xception: Software fault injection and monitoring in processor functional units","volume":"10","author":"carreira","year":"1998","journal-title":"Dependable Computing and Fault Tolerant Systems"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2007.15"},{"journal-title":"Sim-soda A unified framework for architectural level software reliability analysis","year":"2006","author":"fu","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2004.1311877"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/1250662.1250719"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/2.585157"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784522"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2015.7315164"}],"event":{"name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2018,3,19]]},"location":"Dresden, Germany","end":{"date-parts":[[2018,3,23]]}},"container-title":["2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8337149\/8341968\/08342082.pdf?arnumber=8342082","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,5,4]],"date-time":"2018-05-04T11:11:27Z","timestamp":1525432287000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8342082\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":15,"URL":"https:\/\/doi.org\/10.23919\/date.2018.8342082","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}