{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,30]],"date-time":"2025-12-30T08:59:01Z","timestamp":1767085141906},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.23919\/date.2018.8342086","type":"proceedings-article","created":{"date-parts":[[2018,4,23]],"date-time":"2018-04-23T23:20:11Z","timestamp":1524525611000},"source":"Crossref","is-referenced-by-count":29,"title":["SAT-based bit-flipping attack on logic encryptions"],"prefix":"10.23919","author":[{"given":"Yuanqi","family":"Shen","sequence":"first","affiliation":[]},{"given":"Amin","family":"Rezaei","sequence":"additional","affiliation":[]},{"given":"Hai","family":"Zhou","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/3060403.3060469"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2015.7140252"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MSPEC.2013.6607015"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-53140-2_7"},{"key":"ref14","article-title":"Novel bypass attack and bdd-based tradeoff analysis against all known logic locking attacks","author":"xu","year":"2017","journal-title":"Proc Cryptograph Hardware Embedded Syst Conf"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2016.7495588"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2014.6873671"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2334493"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MSPEC.2006.1628506"},{"key":"ref5","article-title":"Defense Science Board. Task Force on High Performance Microchip Supply","year":"2005","journal-title":"Defense Science Board Task Force on High Performance Microchip Supply"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228377"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176634"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.24"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1558607.1558671"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403631"}],"event":{"name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","location":"Dresden","start":{"date-parts":[[2018,3,19]]},"end":{"date-parts":[[2018,3,23]]}},"container-title":["2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8337149\/8341968\/08342086.pdf?arnumber=8342086","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,5,29]],"date-time":"2018-05-29T00:03:02Z","timestamp":1527552182000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8342086\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":15,"URL":"https:\/\/doi.org\/10.23919\/date.2018.8342086","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}