{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T12:23:23Z","timestamp":1725539003299},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.23919\/date.2018.8342087","type":"proceedings-article","created":{"date-parts":[[2018,4,23]],"date-time":"2018-04-23T19:20:11Z","timestamp":1524511211000},"page":"633-636","source":"Crossref","is-referenced-by-count":2,"title":["AMS verification methodology regarding supply modulation in RF SoCs induced by digital standard cells"],"prefix":"10.23919","author":[{"given":"Fabian","family":"Speicher","sequence":"first","affiliation":[]},{"given":"Jonas","family":"Meier","sequence":"additional","affiliation":[]},{"given":"Soheil","family":"Aghaie","sequence":"additional","affiliation":[]},{"given":"Ralf","family":"Wunderlich","sequence":"additional","affiliation":[]},{"given":"Stefan","family":"Heinen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2015.7102520"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5537092"},{"journal-title":"IEEE standard for systemverilog—unified hardware design specification and verification language","first-page":"1","year":"2013","key":"ref6"},{"journal-title":"Digital Integrated Circuits","year":"2002","author":"rabaey","key":"ref5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2014.6851703"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.842894"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2015.2428272"}],"event":{"name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2018,3,19]]},"location":"Dresden, Germany","end":{"date-parts":[[2018,3,23]]}},"container-title":["2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8337149\/8341968\/08342087.pdf?arnumber=8342087","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,5,8]],"date-time":"2018-05-08T14:26:35Z","timestamp":1525789595000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8342087\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":7,"URL":"https:\/\/doi.org\/10.23919\/date.2018.8342087","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}