{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,13]],"date-time":"2025-11-13T07:11:29Z","timestamp":1763017889839},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.23919\/date.2018.8342124","type":"proceedings-article","created":{"date-parts":[[2018,4,23]],"date-time":"2018-04-23T19:20:11Z","timestamp":1524511211000},"page":"851-856","source":"Crossref","is-referenced-by-count":21,"title":["Online analysis of debug trace data for embedded systems"],"prefix":"10.23919","author":[{"given":"Normann","family":"Decker","sequence":"first","affiliation":[]},{"given":"Boris","family":"Dreyer","sequence":"additional","affiliation":[]},{"given":"Philip","family":"Gottschling","sequence":"additional","affiliation":[]},{"given":"Christian","family":"Hochberger","sequence":"additional","affiliation":[]},{"given":"Alexander","family":"Lange","sequence":"additional","affiliation":[]},{"given":"Martin","family":"Leucker","sequence":"additional","affiliation":[]},{"given":"Torben","family":"Scheffel","sequence":"additional","affiliation":[]},{"given":"Simon","family":"Wegener","sequence":"additional","affiliation":[]},{"given":"Alexander","family":"Weiss","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"VPx Base Specification","year":"2013","key":"ref10"},{"journal-title":"FMC FPGA Mezzanine Cards Base Standard","year":"2010","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-70848-5_12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-54862-8_24"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IPDPSW.2017.138"},{"key":"ref15","first-page":"4:1","article-title":"Continuous Non-Intrusive Hybrid WCET Estimation Using Waypoint Graphs","author":"dreyer","year":"2016","journal-title":"16th International Workshop on Worst-Case Execution Time Analysis (WCET 2016)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISORC.2017.16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-20398-5_3"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/2000799.2000800"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/SMARTCOMP-W.2014.7046672"},{"journal-title":"Intel IA-64 Architecture Software Developer s Manual","year":"2016","key":"ref4"},{"journal-title":"CoreSight™ Program Flow Trace™ PFTv1 0 and PFTv1 1 Architecture Specification","year":"2011","key":"ref3"},{"journal-title":"P4080 Advanced QorIQ Debug and Performance Monitoring Reference Manual","year":"2012","key":"ref6"},{"journal-title":"The Nexus 5001™ Forum Standard for a Global Embedded Processor Debug Interface","year":"2012","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4020-8157-6_29"},{"journal-title":"Control Flow Graphs for Real-Time System Analysis Reconstruction from Binary Executables and Usage in ILP-Based Path Analysis","year":"2003","author":"theiling","key":"ref7"},{"journal-title":"CoreSight™ Architecture Specification v2 0","year":"2013","key":"ref2"},{"journal-title":"Software-Test für Embedded Systems Ein Praxishand-buch für Entwickler Tester und technische Projektleiter","year":"2017","author":"gr\u00fcnfelder","key":"ref1"},{"journal-title":"Trace-Data Processing and Profiling Device","year":"2016","author":"weiss","key":"ref9"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MESA.2014.6935586"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/2768566.2768569"},{"journal-title":"Continuous tracing with the RTBx data logger","year":"0","key":"ref21"}],"event":{"name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2018,3,19]]},"location":"Dresden, Germany","end":{"date-parts":[[2018,3,23]]}},"container-title":["2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8337149\/8341968\/08342124.pdf?arnumber=8342124","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,5,8]],"date-time":"2018-05-08T14:27:59Z","timestamp":1525789679000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8342124\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":22,"URL":"https:\/\/doi.org\/10.23919\/date.2018.8342124","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}