{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,17]],"date-time":"2025-09-17T16:53:53Z","timestamp":1758128033798,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.23919\/date.2018.8342136","type":"proceedings-article","created":{"date-parts":[[2018,4,23]],"date-time":"2018-04-23T19:20:11Z","timestamp":1524511211000},"page":"901-904","source":"Crossref","is-referenced-by-count":3,"title":["An efficient NBTI-aware wake-up strategy for power-gated designs"],"prefix":"10.23919","author":[{"given":"Kun-Wei","family":"Chiu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yu-Guang","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ing-Chao","family":"Lin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2523916"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"1041","DOI":"10.1109\/TCAD.2012.2187205","article-title":"Efficient wakeup scheduling considering both resource usage and timing budget for power gating designs","volume":"31","author":"lee","year":"2012","journal-title":"IEEE Transactions on COMPUTER-AIDED DESIGN of Integrated Circuits and Systems (TCAD)"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373462"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"1591","DOI":"10.1109\/TCAD.2014.2334331","article-title":"BTI-aware ST sizing algorithm for reliable power gating designs","volume":"33","author":"wu","year":"2014","journal-title":"IEEE Transactions on COMPUTER-AIDED DESIGN of Integrated Circuits and Systems (TCAD)"},{"journal-title":"Predictive Technology Model (PTM)","year":"0","key":"ref11"},{"journal-title":"Integrated Circuit Design","year":"2011","author":"weste","key":"ref5"},{"key":"ref8","first-page":"1","article-title":"NBTI and leakage aware ST design for reliable and energy efficient power gating","author":"rossi","year":"2015","journal-title":"Proceedings of IEEE European Test Symposium (ETS)"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2011.5722261"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2010324"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2016.7428019"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.832939"}],"event":{"name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2018,3,19]]},"location":"Dresden, Germany","end":{"date-parts":[[2018,3,23]]}},"container-title":["2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8337149\/8341968\/08342136.pdf?arnumber=8342136","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,5,8]],"date-time":"2018-05-08T14:31:00Z","timestamp":1525789860000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8342136\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":11,"URL":"https:\/\/doi.org\/10.23919\/date.2018.8342136","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}