{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T05:33:34Z","timestamp":1725773614583},"reference-count":30,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.23919\/date.2018.8342203","type":"proceedings-article","created":{"date-parts":[[2018,4,23]],"date-time":"2018-04-23T19:20:11Z","timestamp":1524511211000},"page":"1229-1234","source":"Crossref","is-referenced-by-count":3,"title":["Multi-bit non-volatile spintronic flip-flop"],"prefix":"10.23919","author":[{"given":"Christopher","family":"Munch","sequence":"first","affiliation":[]},{"given":"Rajendra","family":"Bishnoi","sequence":"additional","affiliation":[]},{"given":"Mehdi B.","family":"Tahoori","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref30","first-page":"184","article-title":"A 90nm 20mhz fully nonvolatile micro controller for standby-power-critical applications","author":"sakimura","year":"2014","journal-title":"ISSCC"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TVLSI.2015.2496363"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TMAG.2016.2541629"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/TVLSI.2011.2172644"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/ISCDG.2012.6360000"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1049\/el.2010.2039"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1049\/el.2011.1807"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/TVLSI.2016.2630315"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/TCSI.2013.2295026"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/TVLSI.2012.2190535"},{"year":"2002","author":"singh","journal-title":"High speed multiple-bit flip-flop","key":"ref19"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1016\/j.microrel.2011.07.001"},{"year":"0","author":"padhye","journal-title":"Freescale Wireless Low-Power Design and Verification With CPF","key":"ref4"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1109\/JSSC.2013.2284367"},{"year":"2014","author":"singh","journal-title":"As nodes advance so must power analysis","key":"ref3"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1063\/1.3694270"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1109\/MIEL.2012.6222840"},{"key":"ref5","first-page":"143","article-title":"Technology comparison for large last-level caches (L-3 Cs): Low-leakage SRAM, low write-energy STT-RAM, and refresh-optimized eDRAM","author":"chang","year":"2013","journal-title":"HPCA"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/JPROC.2010.2064150"},{"year":"2015","journal-title":"International Technology Roadmap for Semiconductors","key":"ref7"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/MC.2003.1250885"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1038\/nnano.2015.24"},{"year":"2005","author":"yeo","journal-title":"Low Voltage Low Power VLSI Subsystems","key":"ref1"},{"year":"2014","author":"gourav","journal-title":"Using multi-bit flip-flop custom cells to achieve better SoC design efficiency","key":"ref20"},{"year":"2007","author":"zhao","journal-title":"Spin-mtj based non-volatile flip-flop","key":"ref22"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/JSSC.2009.2023192"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/ASPDAC.2016.7428104"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/LED.2013.2297397"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.5573\/JSTS.2013.13.1.058"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1109\/NEWCAS.2013.6573586"}],"event":{"name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2018,3,19]]},"location":"Dresden, Germany","end":{"date-parts":[[2018,3,23]]}},"container-title":["2018 Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8337149\/8341968\/08342203.pdf?arnumber=8342203","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,5,8]],"date-time":"2018-05-08T14:32:21Z","timestamp":1525789941000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8342203\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":30,"URL":"https:\/\/doi.org\/10.23919\/date.2018.8342203","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}