{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T16:07:15Z","timestamp":1780675635268,"version":"3.54.1"},"reference-count":74,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.23919\/date.2018.8342213","type":"proceedings-article","created":{"date-parts":[[2018,4,23]],"date-time":"2018-04-23T23:20:11Z","timestamp":1524525611000},"page":"1289-1298","source":"Crossref","is-referenced-by-count":59,"title":["Computing with ferroelectric FETs: Devices, models, systems, and applications"],"prefix":"10.23919","author":[{"given":"Ahmedullah","family":"Aziz","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Evelyn T.","family":"Breyer","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"An","family":"Chen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiaoming","family":"Chen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Suman","family":"Datta","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sumeet Kumar","family":"Gupta","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Michael","family":"Hoffmann","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiaobo Sharon","family":"Hu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Adrian","family":"Ionescu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Matthew","family":"Jerry","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Thomas","family":"Mikolajick","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Halid","family":"Mulaosmanovic","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kai","family":"Ni","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Michael","family":"Niemier","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ian","family":"O'Connor","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Atanu","family":"Saha","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Stefan","family":"Slesazeck","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sandeep Krishna","family":"Thirumala","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xunzhao","family":"Yin","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2016.00333"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.6b13866"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1080\/00150193.2016.1162021"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268471"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2015.7409718"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2013.6724605"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2012.6242443"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2015.7338406"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268385"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2733382"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ULIS.2017.7962577"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2654066"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.7567\/JJAP.56.04CE07"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838514"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2015.2455342"},{"key":"ref60","volume":"17","author":"kohonen","year":"2012","journal-title":"Associative Memory A System-Theoretical Approach"},{"key":"ref62","first-page":"3123","article-title":"BinaryConnect: Training Deep Neural Networks with Binary Weights During Propagations","author":"courbariaux","year":"2015","journal-title":"NIPS"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2017.28"},{"key":"ref63","author":"courbariaux","year":"2016","journal-title":"Binarized neural networks Training deep neural networks with weights and activations constrained to +1 or ?1"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131532"},{"key":"ref64","first-page":"525","article-title":"XNOR-Net: ImageNet Classification Using Binary Convolutional Neural Networks","author":"rastegari","year":"2016","journal-title":"ECCV"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2759898"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062326"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms15199"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838403"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1145\/2996192"},{"key":"ref68","first-page":"782","article-title":"Binary convolutional neural network on RRAM","author":"tang","year":"2017","journal-title":"ASP-DAC"},{"key":"ref69","year":"0","journal-title":"Predictive Technology Model"},{"key":"ref2","year":"2017","journal-title":"JUMP Research Announcement"},{"key":"ref1","year":"2017","journal-title":"STARnet Research"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIT.2017.7998160"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2015.7409759"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2016.2558149"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/2934583.2934603"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.1996.507792"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2016.7573445"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1021\/nl071804g"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898050"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1145\/1941487.1941507"},{"key":"ref59","doi-asserted-by":"crossref","first-page":"1444","DOI":"10.23919\/DATE.2017.7927219","article-title":"Design and benchmarking of ferroelectric FET based TCAM","author":"yin","year":"2017","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1093\/ietfec\/e88-a.6.1408"},{"key":"ref57","doi-asserted-by":"crossref","first-page":"24","DOI":"10.1109\/MC.2015.376","article-title":"Energy-efficient abundant-data computing: The N3XT 1,000x","volume":"48","author":"aly","year":"2015","journal-title":"Computer"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2014.6844483"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/HOTCHIPS.2011.7477494"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1145\/514191.514197"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/2.612252"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2014.55"},{"key":"ref10","year":"2017","journal-title":"NeuRAM Cube NEUral computing aRchitectures in Advanced Monolithic 3D-VLSI nano-technologies"},{"key":"ref11","author":"salahuddin","year":"2017","journal-title":"Salahuddin NCFET Consortium"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2015.7409777"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838397"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2707664"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2716338"},{"key":"ref15","first-page":"1","article-title":"Exploiting ferroelectric FETs for low-power non-volatile logic-in-memory circuits","author":"yin","year":"2016","journal-title":"Computer-Aided Design (ICCAD) 2016 IEEE\/ACM International Conference on"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342199"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268338"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIT.2017.7998165"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2015.7409760"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2010.2066531"},{"key":"ref3","year":"2017","journal-title":"ICT-31-2017-RIA 3eFERRO Energy Efficient Embedded Non-volatile Memory Logic based on Ferroelectric Hf(Zr)O2"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2016.7599658"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2010.2070470"},{"key":"ref8","year":"0","journal-title":"nanoelectronic COomputing REsearch (nCORE)"},{"key":"ref7","author":"pan","year":"2017","journal-title":"Beyond-CMOS device benchmarking for boolean and non-boolean logic applications"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/ISMVL.2013.32"},{"key":"ref9","year":"2017","journal-title":"H2020 FET Flagship Project Human Brain Project"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2501319"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2290117"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2702741"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2016.2523681"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/NVMTS.2016.7781517"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268425"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2748992"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/NVMTS.2014.7060838"}],"event":{"name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","location":"Dresden, Germany","start":{"date-parts":[[2018,3,19]]},"end":{"date-parts":[[2018,3,23]]}},"container-title":["2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8337149\/8341968\/08342213.pdf?arnumber=8342213","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,5,8]],"date-time":"2018-05-08T18:31:04Z","timestamp":1525804264000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8342213\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":74,"URL":"https:\/\/doi.org\/10.23919\/date.2018.8342213","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}