{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,31]],"date-time":"2024-10-31T02:46:51Z","timestamp":1730342811194,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.23919\/date.2018.8342272","type":"proceedings-article","created":{"date-parts":[[2018,4,23]],"date-time":"2018-04-23T23:20:11Z","timestamp":1524525611000},"page":"1610-1615","source":"Crossref","is-referenced-by-count":9,"title":["Heterogeneous PCM array architecture for reliability, performance and lifetime enhancement"],"prefix":"10.23919","author":[{"given":"Taehyun","family":"Kwon","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Muhammad","family":"Imran","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jung Min","family":"You","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joon-Sung","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2015.7112747"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1816038.1815980"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2155620.2155658"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/1555349.1555372"},{"year":"0","key":"ref14"},{"year":"0","key":"ref15"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1145\/2024716.2024718","article-title":"The gem5 simulator","volume":"39","author":"binkert","year":"2011","journal-title":"SIGARCH Comput Archit News"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.2006.354942"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2012.6169027"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2011.5958219"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2363102"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2485922.2485960"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2014.6962060"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2016.27"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2012.6168941"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.2295825"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2052640"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1735971.1736023"}],"event":{"name":"2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2018,3,19]]},"location":"Dresden, Germany","end":{"date-parts":[[2018,3,23]]}},"container-title":["2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8337149\/8341968\/08342272.pdf?arnumber=8342272","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,5,8]],"date-time":"2018-05-08T18:30:09Z","timestamp":1525804209000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8342272\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":18,"URL":"https:\/\/doi.org\/10.23919\/date.2018.8342272","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}