{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,16]],"date-time":"2025-05-16T05:47:25Z","timestamp":1747374445226},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.23919\/date.2019.8714784","type":"proceedings-article","created":{"date-parts":[[2019,5,16]],"date-time":"2019-05-16T21:29:07Z","timestamp":1558042147000},"page":"78-83","source":"Crossref","is-referenced-by-count":3,"title":["Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator"],"prefix":"10.23919","author":[{"given":"A.","family":"Toro-Frias","sequence":"first","affiliation":[]},{"given":"P.","family":"Saraza-Canflanca","sequence":"additional","affiliation":[]},{"given":"F.","family":"Passos","sequence":"additional","affiliation":[]},{"given":"P.","family":"Martin-Lloret","sequence":"additional","affiliation":[]},{"given":"R.","family":"Castro-Lopez","sequence":"additional","affiliation":[]},{"given":"E.","family":"Roca","sequence":"additional","affiliation":[]},{"given":"J.","family":"Martin-Martinez","sequence":"additional","affiliation":[]},{"given":"R.","family":"Rodriguez","sequence":"additional","affiliation":[]},{"given":"M.","family":"Nafria","sequence":"additional","affiliation":[]},{"given":"F. V.","family":"Fernandez","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837502"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD.2015.7301699"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.09.026"},{"journal-title":"Cadence Design Systems Inc","year":"2011","key":"ref13"},{"journal-title":"Mentor Graphics Inc","year":"2005","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2010.5667399"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-6163-0"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD.2017.7981588"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784605"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2017.8050753"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD.2016.7520729"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2016.05.002"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2331563"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2106850"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEVC.2013.2244898"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456971"},{"key":"ref2","first-page":"26","article-title":"Origin of NBTI Variability in Deeply Scaled pFETs","author":"kaczer","year":"2010","journal-title":"Proc Int Reliab Phys Symp"},{"key":"ref1","first-page":"1322","article-title":"Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies","author":"gielen","year":"2008","journal-title":"Proceedings of Design Automation and Test in Europe (DATE)"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2015.7169231"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD.2017.7981618"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD.2018.8434902"}],"event":{"name":"2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2019,3,25]]},"location":"Florence, Italy","end":{"date-parts":[[2019,3,29]]}},"container-title":["2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8704855\/8714721\/08714784.pdf?arnumber=8714784","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,3]],"date-time":"2019-06-03T23:50:38Z","timestamp":1559605838000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8714784\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":21,"URL":"https:\/\/doi.org\/10.23919\/date.2019.8714784","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}