{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,5]],"date-time":"2025-11-05T06:34:49Z","timestamp":1762324489825},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.23919\/date.2019.8714817","type":"proceedings-article","created":{"date-parts":[[2019,5,16]],"date-time":"2019-05-16T21:29:07Z","timestamp":1558042147000},"page":"320-323","source":"Crossref","is-referenced-by-count":12,"title":["Effect of Device Variation on Mapping Binary Neural Network to Memristor Crossbar Array"],"prefix":"10.23919","author":[{"given":"Wooseok","family":"Yi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yulhwa","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jae-Joon","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2166282"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2018.8510627"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMSCS.2018.2836967"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/2997650"},{"key":"ref8","article-title":"Binarized neural networks: Training deep neural networks with weights and activations constrained to + 1 or ?1","author":"courbariaux","year":"2016","journal-title":"arXiv preprint arXiv 1602 04875"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46493-0_32"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2016.07.006"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2178416"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2016.2546199"}],"event":{"name":"2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2019,3,25]]},"location":"Florence, Italy","end":{"date-parts":[[2019,3,29]]}},"container-title":["2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8704855\/8714721\/08714817.pdf?arnumber=8714817","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,3]],"date-time":"2019-06-03T23:49:46Z","timestamp":1559605786000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8714817\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":9,"URL":"https:\/\/doi.org\/10.23919\/date.2019.8714817","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}