{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,19]],"date-time":"2025-11-19T07:00:25Z","timestamp":1763535625729},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.23919\/date.2019.8714920","type":"proceedings-article","created":{"date-parts":[[2019,5,16]],"date-time":"2019-05-16T21:29:07Z","timestamp":1558042147000},"page":"642-645","source":"Crossref","is-referenced-by-count":5,"title":["Partial Encryption of Behavioral IPs to Selectively Control the Design Space in High-Level Synthesis"],"prefix":"10.23919","author":[{"given":"Zi","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Benjamin Carrion","family":"Schafer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3126566"},{"key":"ref3","doi-asserted-by":"crossref","DOI":"10.1007\/3-540-58484-6_252","article-title":"Genetic Algorithms with Multi-parent Recombination","author":"eiben","year":"1994","journal-title":"Conference on Parallel Problem Solving from Nature"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI.Design.2010.54"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LES.2014.2320556"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2459976.2459985"},{"year":"2017","key":"ref2"},{"key":"ref1","article-title":"Probabilistic multiknob high-level synthesis design space exploration acceleration","author":"schafer","year":"2016","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"}],"event":{"name":"2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2019,3,25]]},"location":"Florence, Italy","end":{"date-parts":[[2019,3,29]]}},"container-title":["2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8704855\/8714721\/08714920.pdf?arnumber=8714920","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T08:47:12Z","timestamp":1643273232000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8714920\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":7,"URL":"https:\/\/doi.org\/10.23919\/date.2019.8714920","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}