{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T11:25:02Z","timestamp":1722943502142},"reference-count":26,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.23919\/date.2019.8715107","type":"proceedings-article","created":{"date-parts":[[2019,5,16]],"date-time":"2019-05-16T17:29:07Z","timestamp":1558027747000},"source":"Crossref","is-referenced-by-count":3,"title":["Identifying the Most Reliable Collaborative Workload Distribution in Heterogeneous Devices"],"prefix":"10.23919","author":[{"given":"Gabriel Piscoya","family":"Davila","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daniel","family":"Oliveira","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Philippe","family":"Navaux","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paolo","family":"Rech","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342104"},{"key":"ref11","article-title":"Architectural vulnerability modeling and analysis of integrated graphics processors","author":"jeon","year":"2013","journal-title":"IEEE workshop on silicon errors in logic-system effects"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1735688.1735702"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IISWC.2016.7581262"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253181"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2009.4798243"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2018.00015"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2005.21"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2014.49"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.02.005"},{"key":"ref3","article-title":"Scientific Discovery through Advanced Computing - The Challenges of Exascale","author":"research","year":"2016"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342117"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2018.8368557"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3030207.3030244"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2018.8368665"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1177\/1094342014522573"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2017.7975269"},{"key":"ref1","article-title":"Top ten exascale research challenges","author":"lucas","year":"2014","journal-title":"DOE ASCAC Data Subcommittee Report"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33715-4_40"},{"key":"ref22","article-title":"9th dimacs","year":"2006"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837289"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/3075564.3075598"},{"key":"ref23","article-title":"Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices","year":"2006"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253181"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/3126908.3126960"}],"event":{"name":"2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)","location":"Florence, Italy","start":{"date-parts":[[2019,3,25]]},"end":{"date-parts":[[2019,3,29]]}},"container-title":["2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8704855\/8714721\/08715107.pdf?arnumber=8715107","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,3]],"date-time":"2019-06-03T19:50:53Z","timestamp":1559591453000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8715107\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":26,"URL":"https:\/\/doi.org\/10.23919\/date.2019.8715107","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}