{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,19]],"date-time":"2026-05-19T14:55:53Z","timestamp":1779202553184,"version":"3.51.4"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.23919\/date.2019.8715263","type":"proceedings-article","created":{"date-parts":[[2019,5,16]],"date-time":"2019-05-16T21:29:07Z","timestamp":1558042147000},"page":"1745-1750","source":"Crossref","is-referenced-by-count":61,"title":["Timing Violation Induced Faults in Multi-Tenant FPGAs"],"prefix":"10.23919","author":[{"given":"Dina","family":"Mahmoud","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mirjana","family":"Stojilovic","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2014.2374072"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-40349-1_11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.6028\/NIST.SP.800-22r1a"},{"key":"ref13","article-title":"Table of linear feedback shift registers","author":"wallker","year":"2017"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/FCCM.2018.00016"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2018.00049"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2013.6604060"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3196494.3196518"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2016.7929182"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2435264.2435283"},{"key":"ref2","first-page":"1111","article-title":"An inside job:remote power analysis attacks on FPGAs","author":"schellenberg","year":"2018","journal-title":"Proceedings of the Design Automation and Test in Europe Conference and Exhibition"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.23919\/FPL.2017.8056840"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2007.79"}],"event":{"name":"2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)","location":"Florence, Italy","start":{"date-parts":[[2019,3,25]]},"end":{"date-parts":[[2019,3,29]]}},"container-title":["2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8704855\/8714721\/08715263.pdf?arnumber=8715263","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,3]],"date-time":"2019-06-03T23:51:09Z","timestamp":1559605869000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8715263\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":13,"URL":"https:\/\/doi.org\/10.23919\/date.2019.8715263","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}