{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T16:14:26Z","timestamp":1759335266830},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,3]]},"DOI":"10.23919\/date48585.2020.9116229","type":"proceedings-article","created":{"date-parts":[[2020,6,15]],"date-time":"2020-06-15T23:28:37Z","timestamp":1592263717000},"page":"290-293","source":"Crossref","is-referenced-by-count":3,"title":["Testing Through Silicon Vias in Power Distribution Network of 3D-IC with Manufacturing Variability Cancellation"],"prefix":"10.23919","author":[{"given":"Koutaro","family":"Hachiya","sequence":"first","affiliation":[]},{"given":"Atsushi","family":"Kurokawa","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"198","article-title":"Comparison of diagnostic performance metrics for test point selection in analog circuits","author":"hachiya","year":"2019","journal-title":"International Workshop on Synthesis and System Integration of Mixed Information Technologies"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/3DIC48104.2019.9058881"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766670"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/SaPIW.2019.8781656"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-DAT.2017.7939646"}],"event":{"name":"2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2020,3,9]]},"location":"Grenoble, France","end":{"date-parts":[[2020,3,13]]}},"container-title":["2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9112295\/9116186\/09116229.pdf?arnumber=9116229","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T21:04:50Z","timestamp":1598994290000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9116229\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,3]]},"references-count":5,"URL":"https:\/\/doi.org\/10.23919\/date48585.2020.9116229","relation":{},"subject":[],"published":{"date-parts":[[2020,3]]}}}