{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,31]],"date-time":"2024-10-31T02:50:15Z","timestamp":1730343015123,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,3]]},"DOI":"10.23919\/date48585.2020.9116354","type":"proceedings-article","created":{"date-parts":[[2020,6,15]],"date-time":"2020-06-15T23:28:37Z","timestamp":1592263717000},"page":"472-477","source":"Crossref","is-referenced-by-count":3,"title":["Modeling a Floating-Gate Memristive Device for Computer Aided Design of Neuromorphic Computing"],"prefix":"10.23919","author":[{"given":"L.","family":"Danial","sequence":"first","affiliation":[]},{"given":"V.","family":"Gupta","sequence":"additional","affiliation":[]},{"given":"E.","family":"Pikhay","sequence":"additional","affiliation":[]},{"given":"Y.","family":"Roizin","sequence":"additional","affiliation":[]},{"given":"S.","family":"Kvatinsky","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"1116","DOI":"10.1109\/T-ED.1984.21674","article-title":"Lucky-electron model of channel hot-electron injection in MOSFETs","volume":"31","author":"ko","year":"1984","journal-title":"IEEE Transactions on Electron Devices"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"718","DOI":"10.1109\/IEDM.1987.191531","article-title":"the impact of gate-induced drain leakage current on mosfet scaling","author":"chan","year":"1987","journal-title":"1987 International Electron Devices Meeting"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCT.1971.1083337"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2009.5404144"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2008.2003332"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2015.2435512"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2015.2433536"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"1424","DOI":"10.1109\/72.548170","article-title":"An analysis of noise in recurrent neural networks: convergence and generalization","volume":"7","author":"jim","year":"1996","journal-title":"IEEE Transactions on Neural Networks"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2012.10.001"},{"year":"0","key":"ref19","article-title":"Y-flash Verilog A model"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/nature06932"},{"key":"ref3","first-page":"817","article-title":"Single transistor learning synapses","author":"hasler","year":"1994","journal-title":"Proc of International Conference on Neural Information Processing"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2014.7047135"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2015.29"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2017.2778940"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1038\/nature14441"},{"key":"ref2","article-title":"Artificial neural networks","volume":"350","author":"mao","year":"1997"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/5.58356"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-019-0331-1"}],"event":{"name":"2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2020,3,9]]},"location":"Grenoble, France","end":{"date-parts":[[2020,3,13]]}},"container-title":["2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9112295\/9116186\/09116354.pdf?arnumber=9116354","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,7,13]],"date-time":"2020-07-13T22:42:29Z","timestamp":1594680149000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9116354\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,3]]},"references-count":19,"URL":"https:\/\/doi.org\/10.23919\/date48585.2020.9116354","relation":{},"subject":[],"published":{"date-parts":[[2020,3]]}}}