{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,8]],"date-time":"2025-04-08T06:23:53Z","timestamp":1744093433843},"reference-count":38,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,3]]},"DOI":"10.23919\/date48585.2020.9116461","type":"proceedings-article","created":{"date-parts":[[2020,6,15]],"date-time":"2020-06-15T23:28:37Z","timestamp":1592263717000},"page":"1031-1036","source":"Crossref","is-referenced-by-count":19,"title":["Automated Test Generation for Trojan Detection using Delay-based Side Channel Analysis"],"prefix":"10.23919","author":[{"given":"Yangdi","family":"Lyu","sequence":"first","affiliation":[{"name":"University of Florida,Department of Computer and Information Science and Engineering,Gainesville,Florida,USA"}]},{"given":"Prabhat","family":"Mishra","sequence":"additional","affiliation":[{"name":"University of Florida,Department of Computer and Information Science and Engineering,Gainesville,Florida,USA"}]}],"member":"263","reference":[{"year":"0","key":"ref38","article-title":"Saededk90core - 90nm digital standard cell li-brary"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8715179"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/s41635-017-0025-y"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/2976749.2978396"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2018.2833059"},{"year":"0","key":"ref37","article-title":"Opencores"},{"year":"0","key":"ref36","article-title":"ISCAS89 sequential benchmark circuits"},{"key":"ref35","article-title":"Z3: An efficient smt solver","author":"moura","year":"2008","journal-title":"TACAS"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2007.4601924"},{"key":"ref10","article-title":"Scalable Test Generation by Interleaving Concrete and Symbolic Execution","author":"qin","year":"2014","journal-title":"VLSI Design"},{"key":"ref11","article-title":"Directed Test Generation for Validation of Cache Coherence Protocols","author":"lyu","year":"2018","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2018.2868362"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2017.7858388"},{"key":"ref14","first-page":"1351","article-title":"Automated Test Generation for Debugging Arithmetic Circuits","author":"farimah farahmandi","year":"2016","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624854"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714989"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC47756.2020.9045731"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342270"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2018.43"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.1103"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2508859.2516654"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.262"},{"key":"ref3","article-title":"MERO: A Statistical Approach for Hardware Trojan Detection","author":"chakraborty","year":"2009","journal-title":"CHES"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2474373"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/2966986.2967061"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2093547"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342260"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC47756.2020.9045449"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-49025-0"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2017.36"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.7"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/2209291.2209297"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2011.49"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/2220336.2220350"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2007.36"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2041846"},{"key":"ref26","article-title":"Detecting trojans through leakage current analysis using multiple supply padIddqs","author":"aarestad","year":"2010","journal-title":"TIFS"},{"key":"ref25","article-title":"Hardware trojan detection using path delay fingerprint","author":"jin","year":"2008","journal-title":"Host"}],"event":{"name":"2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2020,3,9]]},"location":"Grenoble, France","end":{"date-parts":[[2020,3,13]]}},"container-title":["2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9112295\/9116186\/09116461.pdf?arnumber=9116461","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,2]],"date-time":"2022-08-02T23:47:44Z","timestamp":1659484064000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9116461\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,3]]},"references-count":38,"URL":"https:\/\/doi.org\/10.23919\/date48585.2020.9116461","relation":{},"subject":[],"published":{"date-parts":[[2020,3]]}}}