{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,11]],"date-time":"2026-03-11T16:35:30Z","timestamp":1773246930602,"version":"3.50.1"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,3]]},"DOI":"10.23919\/date48585.2020.9116521","type":"proceedings-article","created":{"date-parts":[[2020,6,15]],"date-time":"2020-06-15T19:28:37Z","timestamp":1592249317000},"page":"1586-1589","source":"Crossref","is-referenced-by-count":20,"title":["ROQ: A Noise-Aware Quantization Scheme Towards Robust Optical Neural Networks with Low-bit Controls"],"prefix":"10.23919","author":[{"given":"Jiaqi","family":"Gu","sequence":"first","affiliation":[{"name":"The University of Texas at Austin,ECE Department"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zheng","family":"Zhao","sequence":"additional","affiliation":[{"name":"The University of Texas at Austin,ECE Department"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chenghao","family":"Feng","sequence":"additional","affiliation":[{"name":"The University of Texas at Austin,ECE Department"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hanqing","family":"Zhu","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Microelectronics,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ray T.","family":"Chen","sequence":"additional","affiliation":[{"name":"The University of Texas at Austin,ECE Department"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David Z.","family":"Pan","sequence":"additional","affiliation":[{"name":"The University of Texas at Austin,ECE Department"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898010"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1364\/OE.22.010487"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevX.9.021032"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1364\/OE.27.014009"},{"key":"ref14","article-title":"Quantized neural networks: Training neural networks with low precision weights and activations","author":"hubara","year":"2017","journal-title":"J Mach Learn Res"},{"key":"ref15","article-title":"Neural networks for machine learning","author":"hinton","year":"2012","journal-title":"Coursera video lectures"},{"key":"ref16","author":"timurdogan","year":"0"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2016.7783724"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.18653\/v1\/K18-2025"},{"key":"ref19","article-title":"The MNIST database of handwritten digits","author":"lecun","year":"1998"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.73.58"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC47756.2020.9045156"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1364\/OE.20.001096"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1364\/OPTICA.3.001348"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317770"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317870"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287720"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2017.93"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2017.55"}],"event":{"name":"2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)","location":"Grenoble, France","start":{"date-parts":[[2020,3,9]]},"end":{"date-parts":[[2020,3,13]]}},"container-title":["2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9112295\/9116186\/09116521.pdf?arnumber=9116521","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,2]],"date-time":"2022-08-02T19:47:57Z","timestamp":1659469677000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9116521\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,3]]},"references-count":19,"URL":"https:\/\/doi.org\/10.23919\/date48585.2020.9116521","relation":{},"subject":[],"published":{"date-parts":[[2020,3]]}}}