{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,11]],"date-time":"2026-03-11T16:34:35Z","timestamp":1773246875007,"version":"3.50.1"},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,2,1]]},"DOI":"10.23919\/date51398.2021.9474002","type":"proceedings-article","created":{"date-parts":[[2021,8,24]],"date-time":"2021-08-24T18:11:46Z","timestamp":1629828706000},"page":"1178-1181","source":"Crossref","is-referenced-by-count":14,"title":["Sequential Logic Encryption Against Model Checking Attack"],"prefix":"10.23919","author":[{"given":"Amin","family":"Rezaei","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hai","family":"Zhou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203757"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8715053"},{"key":"ref12","article-title":"Active hardware metering for intellectual property protection and security","author":"alkabani","year":"0","journal-title":"USENIX Security Symposium"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2028166"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"429","DOI":"10.1007\/3-540-65306-6_21","article-title":"The state explosion problem","volume":"1491","author":"valmari","year":"1998","journal-title":"Lectures on Petri Nets I Basic Models Lecture Notes in Computer Science"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2013.6581566"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/54.867894"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2019.00102"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8341984"},{"key":"ref6","first-page":"219","article-title":"Scan design and secure chip","author":"hely","year":"0","journal-title":"International On-Line Testing Symposium"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2015.7140252"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2818722"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2009.15"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176634"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403631"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287691"}],"event":{"name":"2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)","location":"Grenoble, France","start":{"date-parts":[[2021,2,1]]},"end":{"date-parts":[[2021,2,5]]}},"container-title":["2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9473901\/9473226\/09474002.pdf?arnumber=9474002","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,28]],"date-time":"2022-01-28T14:58:29Z","timestamp":1643381909000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9474002\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,2,1]]},"references-count":17,"URL":"https:\/\/doi.org\/10.23919\/date51398.2021.9474002","relation":{},"subject":[],"published":{"date-parts":[[2021,2,1]]}}}