{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T22:21:53Z","timestamp":1725747713586},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,2,1]]},"DOI":"10.23919\/date51398.2021.9474014","type":"proceedings-article","created":{"date-parts":[[2021,8,24]],"date-time":"2021-08-24T22:11:46Z","timestamp":1629843106000},"page":"721-722","source":"Crossref","is-referenced-by-count":1,"title":["Process-Portable and Programmable Layout Generation of Digital Circuits in Advanced DRAM Technologies"],"prefix":"10.23919","author":[{"given":"Youngbog","family":"Yoon","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daeyong","family":"Han","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shinho","family":"Chu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sangho","family":"Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jaeduk","family":"Han","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Junhyun","family":"Chun","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","article-title":"Automatic layout generation for CMOS analog transistors","author":"mathias","year":"0","journal-title":"Proc European Design Automation Conference (EURO-DAC)"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2018.8357061"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1269251"},{"key":"ref1","article-title":"Analog\/Mixed-Signal Design Challenges in 7 -nm CMOS and Beyond","author":"loke","year":"0","journal-title":"Custom Integrated Circuits Conf (CICC)"}],"event":{"name":"2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2021,2,1]]},"location":"Grenoble, France","end":{"date-parts":[[2021,2,5]]}},"container-title":["2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9473901\/9473226\/09474014.pdf?arnumber=9474014","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,28]],"date-time":"2022-01-28T19:58:53Z","timestamp":1643399933000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9474014\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,2,1]]},"references-count":4,"URL":"https:\/\/doi.org\/10.23919\/date51398.2021.9474014","relation":{},"subject":[],"published":{"date-parts":[[2021,2,1]]}}}