{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,18]],"date-time":"2026-08-18T03:52:08Z","timestamp":1787025128047,"version":"build-2736575974"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,2,1]]},"DOI":"10.23919\/date51398.2021.9474035","type":"proceedings-article","created":{"date-parts":[[2021,8,24]],"date-time":"2021-08-24T18:11:46Z","timestamp":1629828706000},"page":"1606-1609","source":"Crossref","is-referenced-by-count":4,"title":["Analyzing ARM CoreSight ETMv4.x Data Trace Stream with a Real-time Hardware Accelerator"],"prefix":"10.23919","author":[{"given":"Seyed Mohammad","family":"Ali Zeinolabedin","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Johannes","family":"Partzsch","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Christian","family":"Mayr","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2019.2921767"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2017.2713393"},{"key":"ref10","first-page":"1","article-title":"Multi-core software\/hardware co-debug platform with ARM CoreSightTM, on-chip test architecture and AXI\/AHB bus monitor","author":"su","year":"0","journal-title":"Proceedings of 2011 International Symposium on VLSI Design, Automation and Test"},{"key":"ref6","article-title":"ARM CoreSight Architecture Specification v2.0","year":"2013","journal-title":"ARM IHI 0029D"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"331","DOI":"10.3850\/9783981537079_0550","article-title":"Integration of ROP\/JOP monitoring IPs in an ARM-based SoC","author":"lee","year":"2016","journal-title":"2016 Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"ref5","article-title":"CoreSight Components Technical Reference Manual","year":"2009","journal-title":"ARM DDI 0314H"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342124"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2020.3002145"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2017.2735383"},{"key":"ref9","article-title":"Trace-data processing and profiling device","author":"weiss","year":"2016","journal-title":"US 9286186 B2"},{"key":"ref1","article-title":"ITRS Reports","year":"0","journal-title":"International Technology Roadmap for Semiconductors"}],"event":{"name":"2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)","location":"Grenoble, France","start":{"date-parts":[[2021,2,1]]},"end":{"date-parts":[[2021,2,5]]}},"container-title":["2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9473901\/9473226\/09474035.pdf?arnumber=9474035","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T15:44:56Z","timestamp":1643298296000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9474035\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,2,1]]},"references-count":11,"URL":"https:\/\/doi.org\/10.23919\/date51398.2021.9474035","relation":{},"subject":[],"published":{"date-parts":[[2021,2,1]]}}}