{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T04:09:20Z","timestamp":1751083760659},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,2,1]]},"DOI":"10.23919\/date51398.2021.9474131","type":"proceedings-article","created":{"date-parts":[[2021,8,24]],"date-time":"2021-08-24T18:11:46Z","timestamp":1629828706000},"page":"26-31","source":"Crossref","is-referenced-by-count":1,"title":["Scalar replacement in the presence of multiple write accesses for high-level synthesis"],"prefix":"10.23919","author":[{"given":"Kenshu","family":"Seto","sequence":"first","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1145\/500001.500025"},{"year":"2016","author":"yuki","journal-title":"Polybench","key":"ref11"},{"year":"0","author":"bastoul","journal-title":"Clan-a polyhedral representation extractor for high level programs","key":"ref12"},{"year":"2020","author":"verdoolaege","journal-title":"Integer Set Library","key":"ref13"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1145\/93542.93553"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1145\/3020078.3021734"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.2197\/ipsjtsldm.11.46"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1007\/978-3-540-24723-4_13"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.2197\/ipsjtsldm.13.2"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.2197\/ipsjtsldm.12.13"},{"key":"ref2","article-title":"Theory and algorithm for generalized memory partitioning in high-level synthesis","author":"cong","year":"0","journal-title":"ACM\/SIGDA International Symposium on FPGAs"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TCAD.2015.2513673"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.2197\/ipsjtsldm.6.71"}],"event":{"name":"2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2021,2,1]]},"location":"Grenoble, France","end":{"date-parts":[[2021,2,5]]}},"container-title":["2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9473901\/9473226\/09474131.pdf?arnumber=9474131","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T16:32:46Z","timestamp":1643301166000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9474131\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,2,1]]},"references-count":13,"URL":"https:\/\/doi.org\/10.23919\/date51398.2021.9474131","relation":{},"subject":[],"published":{"date-parts":[[2021,2,1]]}}}