{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,27]],"date-time":"2026-06-27T16:24:29Z","timestamp":1782577469551,"version":"3.54.5"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,3,14]],"date-time":"2022-03-14T00:00:00Z","timestamp":1647216000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,14]],"date-time":"2022-03-14T00:00:00Z","timestamp":1647216000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,3,14]]},"DOI":"10.23919\/date54114.2022.9774502","type":"proceedings-article","created":{"date-parts":[[2022,5,19]],"date-time":"2022-05-19T20:35:05Z","timestamp":1652992505000},"page":"436-441","source":"Crossref","is-referenced-by-count":6,"title":["Improving Cell-Aware Test for Intra-Cell Short Defects"],"prefix":"10.23919","author":[{"given":"Dong-Zhen","family":"Lee","sequence":"first","affiliation":[{"name":"Realtek Semiconductor Corporation,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ying-Yen","family":"Chen","sequence":"additional","affiliation":[{"name":"Realtek Semiconductor Corporation,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kai-Chiang","family":"Wu","sequence":"additional","affiliation":[{"name":"National Yang Ming Chiao Tung University,Department of Computer Science,Hsinchu,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mango C.-T.","family":"Chao","sequence":"additional","affiliation":[{"name":"Institute of Electronics, National Yang Ming Chiao Tung University,Hsinchu,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000119"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2015.7342383"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2016.25"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-ASIA.2017.8097105"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2019.8704561"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VDAT.2006.258149"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICSCS.2008.4746914"},{"key":"ref17","year":"0","journal-title":"Tessent® CellModelGen Tool Reference Version 2017 3"},{"key":"ref18","year":"0","journal-title":"Tessent® Scan and ATPG User's Manual Version 2017 3"},{"key":"ref19","year":"0","journal-title":"Calibre® xRC™ User's Manual Version 2012 2"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401533"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139151"},{"key":"ref6","first-page":"1","article-title":"Methodology of generating dual-cell-aware tests","author":"huang","year":"2017","journal-title":"Proc of VTS"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2014.6847814"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624825"},{"key":"ref7","first-page":"1","article-title":"DFM-aware fault model and ATPG for intra-cell and inter-cell defects","author":"ainha","year":"2017","journal-title":"Proc of ITC"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699229"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355741"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624906"},{"key":"ref20","year":"0","journal-title":"HSPICE User Guide Basic Simulation and Analysis Version J-2014 09"}],"event":{"name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","location":"Antwerp, Belgium","start":{"date-parts":[[2022,3,14]]},"end":{"date-parts":[[2022,3,23]]}},"container-title":["2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9774496\/9774497\/09774502.pdf?arnumber=9774502","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,11]],"date-time":"2022-07-11T20:06:05Z","timestamp":1657569965000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9774502\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3,14]]},"references-count":20,"URL":"https:\/\/doi.org\/10.23919\/date54114.2022.9774502","relation":{},"subject":[],"published":{"date-parts":[[2022,3,14]]}}}