{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T11:02:31Z","timestamp":1762254151260},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,3,14]],"date-time":"2022-03-14T00:00:00Z","timestamp":1647216000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,14]],"date-time":"2022-03-14T00:00:00Z","timestamp":1647216000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,3,14]]},"DOI":"10.23919\/date54114.2022.9774502","type":"proceedings-article","created":{"date-parts":[[2022,5,19]],"date-time":"2022-05-19T20:35:05Z","timestamp":1652992505000},"page":"436-441","source":"Crossref","is-referenced-by-count":3,"title":["Improving Cell-Aware Test for Intra-Cell Short Defects"],"prefix":"10.23919","author":[{"given":"Dong-Zhen","family":"Lee","sequence":"first","affiliation":[{"name":"Realtek Semiconductor Corporation,Taiwan"}]},{"given":"Ying-Yen","family":"Chen","sequence":"additional","affiliation":[{"name":"Realtek Semiconductor Corporation,Taiwan"}]},{"given":"Kai-Chiang","family":"Wu","sequence":"additional","affiliation":[{"name":"National Yang Ming Chiao Tung University,Department of Computer Science,Hsinchu,Taiwan"}]},{"given":"Mango C.-T.","family":"Chao","sequence":"additional","affiliation":[{"name":"Institute of Electronics, National Yang Ming Chiao Tung University,Hsinchu,Taiwan"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/ITC44170.2019.9000119"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TEST.2015.7342383"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/ATS.2016.25"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/ITC-ASIA.2017.8097105"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/LATW.2019.8704561"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/VDAT.2006.258149"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/ICSCS.2008.4746914"},{"year":"0","journal-title":"Tessent® CellModelGen Tool Reference Version 2017 3","key":"ref17"},{"year":"0","journal-title":"Tessent® Scan and ATPG User's Manual Version 2017 3","key":"ref18"},{"year":"0","journal-title":"Calibre® xRC™ User's Manual Version 2012 2","key":"ref19"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TEST.2012.6401533"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TEST.2011.6139151"},{"key":"ref6","first-page":"1","article-title":"Methodology of generating dual-cell-aware tests","author":"huang","year":"2017","journal-title":"Proc of VTS"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/ETS.2014.6847814"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/TEST.2018.8624825"},{"key":"ref7","first-page":"1","article-title":"DFM-aware fault model and ATPG for intra-cell and inter-cell defects","author":"ainha","year":"2017","journal-title":"Proc of ITC"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TEST.2010.5699229"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TEST.2009.5355741"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TEST.2018.8624906"},{"year":"0","journal-title":"HSPICE User Guide Basic Simulation and Analysis Version J-2014 09","key":"ref20"}],"event":{"name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","start":{"date-parts":[[2022,3,14]]},"location":"Antwerp, Belgium","end":{"date-parts":[[2022,3,23]]}},"container-title":["2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9774496\/9774497\/09774502.pdf?arnumber=9774502","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,11]],"date-time":"2022-07-11T20:06:05Z","timestamp":1657569965000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9774502\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3,14]]},"references-count":20,"URL":"https:\/\/doi.org\/10.23919\/date54114.2022.9774502","relation":{},"subject":[],"published":{"date-parts":[[2022,3,14]]}}}